Automated Laser Cleaning for Probe Card Needles
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Solution Overview
Problem
The diverse shapes and positions of needles on probe cards complicate the processes of testing and cleaning, as existing methods rely on manual operation and lack precision, leading to inefficiencies and potential damage.
Innovation Solution
A test system that uses a camera to scan and focus a laser beam on the needles, allowing for auto-focusing and auto-cleaning by comparing scan results with stored images and adjusting the laser beam's position to ensure accurate cleaning, with the ability to generate maps for precise cleaning and monitoring.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual cleaning methods are used for probe card needles, then operational flexibility is maintained, but cleaning precision and efficiency deteriorate
Solution Approach 1:
The patent replaces manual mechanical cleaning operations with an automated laser cleaning system. The laser beam is precisely controlled by a control unit to clean needle surfaces without requiring manual intervention, thereby improving cleaning precision while maintaining ease of operation through automation.
Solution Approach 2:
The system enables self-service cleaning where the probe card needles are automatically cleaned by the laser system without requiring external manual operation. The control unit autonomously manages the cleaning process based on pre-set parameters, allowing the system to service itself.
2Productivity
If automated laser cleaning is implemented, then cleaning efficiency and precision are improved, but system complexity increases
Solution Approach 1:
The test system is designed with multi-functionality, integrating both testing and cleaning operations within a single system. The laser unit and control mechanisms serve dual purposes, enabling the system to perform multiple functions without proportionally increasing complexity.
Solution Approach 2:
The patent merges the cleaning function with the existing test system structure. The laser cleaning unit is integrated into the probe card holder assembly, combining multiple functions (testing and cleaning) into a unified system rather than separate independent systems.
3Duration of action of stationary object
If manual cleaning processes are used, then device complexity remains low, but cleaning thoroughness and needle lifespan are reduced
Solution Approach 1:
Manual mechanical cleaning is replaced with laser-based cleaning, which extends needle lifespan by avoiding physical contact and mechanical wear. The laser cleanly removes contaminants without the abrasion inherent in manual cleaning methods.
Solution Approach 2:
The system provides self-service cleaning that maintains needles in optimal condition, extending their operational lifespan. The automated laser cleaning process consistently removes contaminants without the variability and potential damage associated with manual cleaning operations.
4Manufacturing precision
If automated scanning and focusing are implemented, then positioning precision is improved, but measurement and detection difficulty increases
Solution Approach 1:
The system employs feedback mechanisms where scan results are automatically analyzed and used to adjust laser focusing and positioning. The control unit processes scan data and provides real-time feedback to optimize the cleaning operation, improving positioning precision while managing detection complexity through automated feedback loops.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system enables efficient, precise, and automated cleaning of probe card needles, improving productivity and extending the lifespan of the probe cards by ensuring thorough and targeted cleaning without manual intervention.
Implementation Method 1
a laser beam is focused on at least one of the needles based on the scan result and the laser beam is irradiated on the at least one of the needles to clean the at least one of the needles
Data Source
AI summary
A method of cleaning needles of a probe card in a test system includes mounting the probe card, which has a plurality of device under tests (DUTs) and needles, in a card mounting part. The DUTs and needles are scanned using a camera positioned in the test system to provide a scan result. A laser beam is focused on at least one of the needles based on the scan result and the laser beam is irradiated on the at least one of the needles to clean the at least one of the needles.