Probe Card Lens Unit Holder for Quick Replacement
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Solution Overview
Problem
Existing probe cards require costly and time-consuming replacement when lens changes are needed, as existing solutions often necessitate new probe cards or physical force to detach lenses, leading to inefficiencies in wafer testing and maintenance.
Innovation Solution
A probe card design featuring a holder unit with a higher coefficient of friction and a detachable lens system, allowing for easy lens replacement without replacing the entire probe card, using a jig with tapered through holes and a protrusion part for secure lens attachment and detachment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the entire probe card is replaced when lens changes are needed, then the lens can be changed, but the manufacturing cost and time increase significantly
Solution Approach 1:
The probe card is divided into separate functional modules: a reusable probe card body and interchangeable lens units. The holder unit secures the lens unit to the probe card body through engagement features (protrusions fitting into recesses), allowing the lens unit to be detached and replaced without affecting the probe card body or other components.
Solution Approach 2:
The lens unit is extracted as a separate, removable component from the probe card system. The holder unit provides a dedicated mounting structure that allows the lens unit to be easily removed and replaced, separating the lens replacement operation from the entire probe card replacement process.
2Ease of repair
If physical force is used to detach lenses from existing probe cards, then the lens can be removed, but the probe card structure may be damaged
Solution Approach 1:
The holder unit is pre-equipped with engagement features (protrusions and recesses) that are designed to securely hold the lens unit during use and facilitate its controlled removal. The release hole and release groove features enable a controlled release mechanism that detaches the lens unit without requiring forceful manual intervention that could damage the probe card structure.
Solution Approach 2:
The holder unit acts as an intermediary component between the probe card body and the lens unit. It provides a dedicated interface with engagement features that mediate the connection and detachment process, eliminating the need for direct forceful interaction between the lens and the probe card body, thus protecting the structural integrity of the probe card.
3Reliability
If lenses are permanently attached to probe cards, then the optical characteristics are stable, but lens replacement requires manufacturing a new probe card
Solution Approach 1:
The probe card system is segmented into a reusable probe card body and interchangeable lens units. The holder unit provides secure engagement features (protrusions fitting into recesses) that ensure stable optical characteristics during testing, while the modular design allows lens units to be manufactured separately and replaced without remanufacturing the entire probe card.
Solution Approach 2:
The probe card body with the holder unit serves as a universal platform that can accommodate multiple different lens units. The standardized engagement features allow the same probe card body to be used with various lens units, reducing manufacturing costs by eliminating the need to create custom probe cards for each lens type.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables quick and cost-effective lens changes, reducing manufacturing costs and time, while simplifying maintenance by allowing lens attachment and detachment without replacing the probe card, thereby improving the efficiency of wafer testing.
Implementation Method 1
the holder unit has a coefficient of friction that is higher than a coefficient of friction of a portion of the jig near the holder unit
Data Source
AI summary
Probe cards that can replace lens units are disclosed. In some implementations, a probe card may include a lens unit through which light irradiated from a light source unit; a jig into which the lens unit is inserted inside, and a holder unit for closely supporting the lens unit.