Probe Card PCB Circuit Pattern for Multi-Side Testing

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional probe cards require at least two different printed circuit boards (PCBs) with distinct circuit patterns to perform top-side, bottom-side, and both-side needle tests, leading to increased costs and time consumption, as well as obstructed space for accurate testing due to cable placement.

Innovation Solution

A specially designed PCB circuit pattern compatible with top-side, bottom-side, and both-side needle tests, allowing a single probe card to conduct all three tests, reducing the need for multiple PCBs and improving signal quality by using a unified circuit pattern.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If conventional probe cards use separate PCBs for top-side, bottom-side, and both-side needle tests, then each test can be performed with dedicated circuit patterns, but the device complexity and cost increase due to requiring at least two different PCB designs

Engineering Contradiction:
Improvetesting capabilityVSAvoidPCB design complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies universality by designing a single PCB that can support all three needle test types (top-side, bottom-side, and both-side) through strategically placed opening regions. The PCB includes first and second circuit patterns with corresponding opening regions that allow probe needles to access bonding pads from different directions, enabling one PCB to replace multiple specialized PCBs while maintaining full testing versatility

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent segments the PCB into distinct regions with different circuit patterns and opening configurations. The first circuit pattern includes first opening regions while the second circuit pattern includes second opening regions, allowing different portions of the same PCB to serve different testing functions. This segmentation enables the single PCB to accommodate multiple needle types without interfering with each other

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If conventional probe cards use separate PCBs for different needle tests, then each region can be optimized for specific testing, but time consumption increases due to the need to switch between different PCB designs

Engineering Contradiction:
Improvetesting coverageVSAvoidtesting time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The universal PCB design eliminates the need to switch between different PCBs when changing test types. The single PCB includes all necessary circuit patterns and opening regions configured to support top-side, bottom-side, and both-side needle tests, allowing technicians to perform all tests on the same PCB without time loss from PCB replacement or reconfiguration

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Adaptability or versatility

If cables are connected to regions 22 and 24 for both-side needle test, then all regions can be accessed, but space for picoprober is blocked causing testing problems in region 17

Engineering Contradiction:
Improvecable connection flexibilityVSAvoidpicoprober access
Core Design Contradiction:
Adaptability or versatilityVSEase of operation

Solution Approach 1:

The patent segments the PCB into distinct circuit patterns with dedicated opening regions. The first circuit pattern has first opening regions and the second circuit pattern has second opening regions, creating separate access paths for cables and picoprobers. This segmentation allows cables to be connected to certain regions while leaving other regions accessible to the picoprober, solving the space blocking problem in region 17

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS7459925B1Probe card
Publication Date: 2008.12.02 NAN YA TECH
  • US7459925B1 patent drawing
  • US7459925B1 patent drawing
  • US7459925B1 patent drawing

AI summary

A PCB of a probe card includes a first region, a second region, a third region and a fourth region arranged clockwise. The circuit pattern of the first region corresponds to the circuit pattern of the third region. The circuit pattern of the second region corresponds to the circuit pattern of the fourth region, wherein the circuit pattern of the first region is different from the circuit pattern of the second region.