Probe Card Power Circuit Low Resistance Design

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Solution Overview

Problem

Conventional probe cards experience significant power signal attenuation due to high resistance in the power conducting circuit, leading to insufficient power supply and misjudgment of test signals when transmitting high-frequency power signals to a device under test.

Innovation Solution

The probe card design incorporates a power conducting circuit with a significantly lower resistance than the signal conducting circuit, utilizing conductive materials and structured substrates with specific resistance and dielectric constant ratios to minimize power signal attenuation, ensuring efficient transmission of high-frequency power signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of energy

If the power conducting circuit uses the same resistance as the signal conducting circuit, then the circuit design is simple and uniform, but the power signals are greatly attenuated due to high resistance

Engineering Contradiction:
Improvepower signal attenuationVSAvoidcircuit design complexity
Core Design Contradiction:
Loss of energyVSDevice complexity

Solution Approach 1:

The patent applies local quality by assigning different resistance characteristics to different parts of the circuit. The power conducting circuit is designed with lower resistance (achieved through wider trace width, thicker copper layer, or shorter length) compared to the signal conducting circuit. This localized optimization ensures that power signals experience minimal attenuation while signal circuits maintain their designed impedance characteristics for accurate signal transmission.

Inventive Principle:
Principle #3Local quality

2Reliability

If the power conducting circuit has low resistance, then power signals are transmitted efficiently, but the circuit structure becomes more complex

Engineering Contradiction:
Improvepower supply reliabilityVSAvoidcircuit structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent employs parameter changes by modifying physical dimensions and material properties of the power conducting circuit. Specifically, the trace width is increased, copper layer thickness is enhanced, or conductor material is optimized to reduce resistance. These parameter adjustments lower the resistance of the power circuit, ensuring reliable power delivery to the DUT while maintaining a relatively simple overall circuit structure through controlled variations in geometric and material parameters.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design effectively transmits high-frequency power signals without substantial attenuation, preventing device malfunction due to insufficient power and ensuring accurate test signal interpretation.

Implementation Method 1

each power conducting circuit electrically connects the tester and another end of one of the signal pins... each power conducting circuit is used to transmit the power signals to the DUT

Methodology Applied
Scientific EffectElectrical Conduction: Conduction (electrical)

Implementation Method 2

when the tester transmits the high-frequency power signals to the probe card, the conducting circuit for power signals will generate a high resistance, which attenuates the power signals

Methodology Applied
Scientific EffectJoule Heating: Joule Heating

Data Source

PatentUS9316685B2Probe card of low power loss
Publication Date: 2016.04.19 MPI CORP
  • US9316685B2 patent drawing
  • US9316685B2 patent drawing
  • US9316685B2 patent drawing

AI summary

A probe card, which is used to transmit power signals and test signals from a tester to a DUT, includes a pin base, a plurality of signal pins, a signal conducting circuit and at least one power conducting circuit. The signal pins are made of conductive materials, and each contacts the DUT with an end thereof; the signal conducting circuit has a first resistance, and electrically connects the tester and the other end of one of the signal pin to transmit the test signals to the DUT; the power conducting circuit has a second resistance which is much less than the first resistance, and electrically connects the tester and the other end of one of the signal pin which is not connected with the signal conducting circuit to transmit the power signals to the DUT.