Probe Card Pusher Needle Mechanism for UUT Sticking Mitigation

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Solution Overview

Problem

During electronic component testing, probe cards often experience sticking issues with units-under-test (UUTs), leading to damage and delays due to inadequate mechanical separation forces, especially when conductive probes become wedged or mechanically attached during testing.

Innovation Solution

A probe card with a guide plate and a pushing mechanism, including a pusher needle and support, which can extend and retract to apply a controlled mechanical force to disengage the probe card from the UUT, mitigating sticking by providing a precise separation force.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional probe cards are used without a pushing mechanism, then the testing process is simple, but the probe card and UUT may stick together causing damage and delays

Engineering Contradiction:

Improveprevention of sticking damageVSAvoidprobe card structure

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The probe card is segmented into functional modules: guide plates with holes for probe alignment, pusher needles for separation force, and support structures. This modular segmentation allows each component to perform its specific function independently, enabling reliable sticking prevention while maintaining manageable complexity through standardized modular design

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Pusher needles serve as intermediary elements between the guide plate and the UUT. These needles transmit the separation force from the probe card to the UUT, mediating the interaction to prevent sticking damage without requiring direct contact between the main probe card body and the UUT, thus protecting both components

Inventive Principle:

Principle #24Intermediary (Mediator)

2Object-affected harmful factors

If a pushing mechanism is added to prevent sticking, then damage is prevented, but the device complexity increases

Engineering Contradiction:

Improvesticking damageVSAvoidprobe card structure

Core Design Contradiction:

Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The pusher needles are designed to automatically extend and retract based on the testing cycle. During testing, the needles remain retracted to allow probe contact. After testing, the needles automatically extend to apply separation force and then retract. This self-service mechanism eliminates the need for complex external control systems, preventing sticking damage while minimizing added complexity

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The guide plate serves multiple functions: it provides structural support for the probe card, defines the positioning holes for probe alignment, and serves as the mounting base for the pusher needles. This multi-functionality reduces the need for separate components, allowing sticking prevention to be integrated into the existing probe card structure without proportionally increasing complexity

Inventive Principle:

Principle #6Universality (Multi-functionality)

3Productivity

If manual separation is used after testing, then the process is simple, but manufacturing delays occur due to stuck components

Engineering Contradiction:

Improvetesting cycle speedVSAvoidseparation operation

Core Design Contradiction:

ProductivityVSEase of operation

Solution Approach 1:

The manual mechanical separation operation is replaced with an automated pushing mechanism. The pusher needles are actuated by a control system that automatically extends them to apply separation force after testing, eliminating the need for manual intervention. This substitution maintains simple operation while dramatically improving productivity by preventing sticking-related delays

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS11486923B2Apparatuses and methods for mitigating sticking of units-under-test

Publication Date: 2022.11.01 INTEL CORP

AI summary

Disclosed herein are apparatuses and methods for mitigating sticking of units-under-test (UUTs). For example, in some embodiments, a probe card may include a probe landing pad, a guide plate having a hole therein, and a pushing mechanism. The pushing mechanism may include a pusher needle and a pusher needle support, the pusher needle support may be between the probe landing pad and the guide plate, and the pusher needle support may be controllable to cause the pusher needle to extend and retract through the hole in the guide plate.