Probe Card Relay Testing via Electrical Measurement
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Solution Overview
Problem
Conventional relay driving tests for probe cards face challenges such as long testing times, limited capability in testing specific circuit configurations, damage to needle tips, and inability to test probe cards with multiple relays in a final mounted state, leading to unreliable relay driving and inefficient testing processes.
Innovation Solution
A probe card test system and method utilizing a tester with a DC power source, control board, measurement circuits, and changeover switches to automatically and continuously test relays without physical contact, using capacitance and resistance measurements to determine relay operation and calculate electrostatic capacitance differences to assess relay functionality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual testing method is used with handy tester directly contacting circuit, then testing can be performed, but testing time becomes long and testing cannot be performed depending on packaging density
Solution Approach 1:
The patent replaces the mechanical contact-based testing method (handy tester directly contacting circuit) with an automatic testing system that uses electrical signals through measurement channels. The tester automatically applies voltages to relay control channels and measures terminal voltages without physical contact, eliminating the time-consuming manual operations while maintaining testing capability.
Solution Approach 2:
The patent implements preliminary action by pre-configuring the probe card with relays mounted on substrates before testing. The automatic testing system then tests the relays in their pre-mounted state on the probe card, rather than requiring individual testing after mounting. This allows the testing to be performed in advance of final assembly, significantly reducing testing time while maintaining full testing capability.
2Productivity
If device-based automatic testing is used with needle tips brought into contact, then testing efficiency improves, but needle tips get damaged and only specific circuit configurations can be tested
Solution Approach 1:
The patent replaces the mechanical needle tip contact system with an electrical measurement system. Instead of bringing physical needle tips into contact with relay terminals, the system uses measurement channels to apply voltages and measure terminal voltages electrically. This eliminates mechanical wear and damage to needle tips while maintaining high testing efficiency through automated operations.
Solution Approach 2:
The patent implements universality by designing a testing system that can handle various circuit configurations through software control and flexible measurement channels. The system can test different relay types and circuit arrangements without requiring physical changes to the testing apparatus, unlike needle tip methods that are limited by physical contact constraints. This enables the system to test multiple circuit configurations efficiently without compromising needle tip durability.
3Ease of manufacture
If individual testing of main substrate and sub-substrates is performed, then testing can be completed, but relay driving cannot be guaranteed in final mounted state
Solution Approach 1:
The patent applies preliminary action by testing the relays on the probe card in their final mounted state before actual product assembly. The testing system connects to the completed probe card assembly and performs relay driving tests on the integrated structure, ensuring that relay functionality is verified in the exact configuration where it will operate. This confirms relay driving reliability in the final mounted state while maintaining ease of manufacture through a streamlined testing process.
Solution Approach 2:
The patent merges the testing of the main substrate and sub-substrates into a single integrated testing process. Instead of separately testing each component and then assembling them, the system tests the complete assembled probe card with all substrates combined. This ensures that relay driving is guaranteed in the final mounted state, as the testing reflects the actual operational configuration, while the merging process simplifies the overall manufacturing workflow.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and reliable testing of probe cards with multiple relays in a mounted state, improving testing efficiency and identifying potential mounting failures and defective products, thereby enhancing product reliability.
Implementation Method 1
a first measurement circuit including a first resistor having a predetermined time constant and a first changeover switch to be connected to the first measurement channel, the DC power source and the first resistor are connected to the first changeover switch, and the first measurement channel is switchingly connected to the DC power source or the first resistor by the first changeover switch
Implementation Method 2
the first measurement circuit includes a first resistor having a predetermined time constant
Data Source
AI summary
It is aimed to provide a probe card test system and a relay driving test method for probe cards which can automatically and continuously perform tests without bringing needle tips into contact with a number of relays mounted on a probe card and by using a device. In a probe card test system for testing a probe card using a tester, the probe card includes a substrate having a first probe and a first relay connected to the first probe, a relay controller for the first relay and a first measurement channel for connecting the first relay and the first probe to the tester are further provided on the substrate. The tester includes a DC power supply, a control board for controlling the relay controller for the first relay, and a first measurement circuit connected to the first measurement channel, the DC power supply and a voltmeter. The first measurement circuit includes a first resistor having a predetermined time constant and a first changeover switch to be connected to the first measurement channel. The DC power supply and the first resistor are connected to the first changeover switch, and the first measurement channel is switchingly connected to the DC power supply or the first resistor by the first changeover switch.