Probe Card Rotatable Cap For Guided Module Assembly
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Solution Overview
Problem
Existing probe cards face challenges in precise assembly and disassembly due to strict positioning and leveling requirements, complicating the manipulation process.
Innovation Solution
A probe card design featuring a rotatable module cap with grooves for easy installation and removal of probe modules, combined with a cap base and level calibrating components to ensure accurate alignment and reduce manipulation errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a conventional probe card structure is used, then the probe module can be installed on the substrate, but the assembly and disassembly process becomes complex and manipulation deviation increases due to strict positioning and leveling requirements
Solution Approach 1:
The probe card is divided into separate functional modules: a substrate, a rotatable module cap, and a probe module. The module cap can be rotated independently to align grooves with the probe module for easy installation and removal, while maintaining precise positioning through the groove structure.
Solution Approach 2:
The module cap is designed to be rotatable rather than fixed, allowing dynamic adjustment during assembly and disassembly operations. This rotation capability enables the grooves to align with the probe module edges, simplifying the manipulation process while maintaining positioning precision.
2Reliability
If strict positioning and leveling requirements are imposed, then conduction quality inspection reliability is improved, but the assembly and disassembly process becomes more complex
Solution Approach 1:
The rotatable module cap acts as an intermediary component between the substrate and the probe module. It provides grooves that guide the probe module into correct positioning while allowing rotational adjustment, thus ensuring inspection reliability without complicating the assembly process.
Solution Approach 2:
The grooves on the module cap are pre-positioned to align with the probe module edges before installation. This preliminary alignment feature ensures that when the module cap is rotated to the correct position, the probe module automatically achieves proper positioning and leveling, maintaining reliability without increasing operational complexity.
Data Source
AI summary
The present invention provides a probe card. A module cap, on the probe card substrate, is designed to have a chute and the probe module can be installed on or uninstalled from the module cap via the chute. That simplifies the operations of assembling and disassembling the probe card and avoids positioning error.


