Automated Probe Card Test System With Inverter And Optical Inspection
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Solution Overview
Problem
Existing manual probe card test methods are inefficient for testing large quantities of probe cards of varying diameters, leading to potential defects and increased testing time, as they require manual handling and are not capable of inverting heavy or stacked probe cards with ease.
Innovation Solution
A probe card test system that automates the testing process using a loader, inverter, transferer, test table mover, and optical system to rapidly and accurately test probe pins of various diameters, including small and large-diameter cards, by inverting and precisely moving the probe cards to facilitate optical inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual testing method is used, then testing process is simple to implement, but testing efficiency is low and large quantity of probe cards cannot be tested rapidly
Solution Approach 1:
The patent replaces manual mechanical operations with an automated testing system that includes a loader, inverter, transferer, test table mover, and optical system. This automation substitutes human labor with mechanical systems controlled by a controller, enabling rapid sequential testing of multiple probe cards without manual intervention for each card.
Solution Approach 2:
The loader pre-loads multiple probe cards onto the test table in sequence before testing begins. The inverter pre-inverts probe cards to the correct orientation. This preliminary preparation allows the testing process to proceed rapidly without interruption for loading or repositioning individual cards during the testing sequence.
2Ease of operation
If probe cards are stacked in waiting area with probe pins facing downward, then storage space is efficient, but inversion for testing is difficult and time-consuming
Solution Approach 1:
The inverter automatically performs the inversion operation mechanically using a transferer mechanism. Instead of manual handling, the system uses automated mechanical arms and transfer mechanisms to flip probe cards from pins-downward to pins-upward orientation, making the process rapid and consistent regardless of card size or weight.
3Productivity
If automated test system is configured, then testing efficiency is improved, but mechanical configuration becomes complex and difficult to implement
Solution Approach 1:
The automated testing system is divided into distinct functional modules: a loader for loading probe cards, an inverter for orientation change, a transferer for movement, a test table mover for positioning, and an optical system for testing. Each module performs a specific function and can be independently controlled, simplifying the overall system configuration and maintenance while maintaining high productivity.
Solution Approach 2:
The test table is designed to accommodate probe cards of various diameters through adjustable positioning mechanisms. The optical system can test probe pins across different card sizes, making the entire system universal and adaptable to multiple probe card specifications without requiring separate testing equipment for each size.
4Adaptability or versatility
If probe cards of various diameters are tested, then versatility is improved, but mechanical configuration becomes more difficult
Solution Approach 1:
The test table incorporates movable and adjustable components that can dynamically adapt to different probe card diameters. The table mover can adjust positioning parameters, and the optical system can adjust its scanning range and focal points, allowing the same mechanical configuration to handle various card sizes through programmable motion control rather than physical reconfiguration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system enables rapid and accurate testing of a large quantity of probe cards with a short waiting time, preventing defects and reducing testing time, labor, and cost while increasing precision and productivity.
Implementation Method 1
an optical system for optically testing the probe pins of the probe card
Data Source
AI summary
Provided is a probe card test system and method, the probe card test system including a loader for loading and placing a probe card for testing electrical properties of a substrate, on a holder, an inverter for transferring the probe card placed on the holder, to a preliminary position by inverting the probe card, a transferer for transferring the probe card transferred to the preliminary position, to a test table, a test table mover for precisely moving the test table in a first direction to test probe pins of the probe card, an optical system for optically testing the probe pins of the probe card, and an optical system mover for precisely moving the optical system or the test table in a second direction perpendicular to the first direction, to test all the probe pins of the probe card.