Semiconductor Test Probe With Integrated Conductive Member
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Solution Overview
Problem
Existing semiconductor device test probes face challenges in stably transmitting test signals due to high resistance and complex configurations, leading to increased testing costs.
Innovation Solution
A probe design featuring an upper and lower plunger, an elastic member for spacing, and a conductive member that connects them only when needed, reducing resistance and improving conductivity through a simple configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional probe structure is used, then the configuration is simple, but the test signal transmission is unstable due to high resistance
Solution Approach 1:
The conductive member integrates multiple functions: it provides electrical connection between plungers, acts as an elastic element for contact force, and serves as a structural component within the barrel. This merging of functions reduces the need for separate components, improving reliability without significantly increasing complexity
Solution Approach 2:
The conductive member is designed to perform multiple roles simultaneously: electrical conduction, mechanical elasticity, and structural support. This multi-functionality addresses the transmission stability issue while maintaining a relatively simple overall probe configuration
2Reliability
If a complex probe configuration is used, then test signal transmission stability improves, but manufacturing complexity and costs increase
Solution Approach 1:
By combining the conductive and elastic functions into a single conductive member, the manufacturing process is simplified. Instead of assembling multiple separate components (conductive elements, elastic elements, structural parts), the probe can be manufactured with fewer assembly steps, reducing complexity and cost while achieving stable signal transmission
3Reliability
If additional conductive members are added to improve conductivity, then test signal transmission stability improves, but device complexity increases
Solution Approach 1:
Rather than adding separate conductive members to an existing structure, the invention merges the conductive function with the elastic member itself. This single integrated conductive member provides both the mechanical elasticity needed for contact and the electrical conductivity for signal transmission, improving conductivity stability without proportionally increasing structural complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The probe stably transmits test signals with reduced resistance and costs, achieving improved conductivity and cost-effectiveness by using a conductive member like a coil spring or conductive rubber.
Implementation Method 1
an elastic member which is disposed between the upper plunger and the lower plunger, and elastically biases the upper and lower plungers to have them spaced from each other
Implementation Method 2
a conductive member which is disposed in an inside or outside of the elastic member and electrically connects the upper plunger and the lower plunger
Data Source
AI summary
Disclosed is a probe which stably transmits a test signal. The probe electrically connects a semiconductor device and a tester for testing the semiconductor device. The probe may include an upper plunger which is configured to be electrically connected to the semiconductor device; a lower plunger which is configured to be electrically connected to the tester; an elastic member which is disposed between the upper plunger and the lower plunger, and elastically biases the upper and lower plungers to have them spaced from each other; a conductive member which is disposed in an inside or outside of the elastic member and electrically connects the upper plunger and the lower plunger; and a barrel which accommodates therein the upper plunger, the lower plunger, the elastic member and the conductive member.