Probe Correction System Using TDR Signal Segmentation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing probe correction systems require a test fixture to be connected to a measurement device, leading to inefficiencies and reduced accuracy, especially when all channels are in use, making calibration and re-calibration challenging.
Innovation Solution
A probe correction system utilizing a time domain reflectometry signal source, test fixture, and measurement device that allows for measurement without connecting the test fixture to the measurement device, enabling efficient and accurate probe correction through signal measurement and analysis, including time-domain and frequency representations, and calibration processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a test fixture is connected to a measurement device for probe correction, then measurement accuracy can be maintained, but measurement efficiency decreases and the system becomes less flexible when all channels are in use
Solution Approach 1:
The system separates the correction signal generation (TDR signal source) from the main measurement device, allowing independent probe correction without occupying measurement channels. This segmentation enables the correction function to operate autonomously while maintaining measurement accuracy.
Solution Approach 2:
A test fixture serves as an intermediary component that receives TDR correction signals and facilitates probe correction without requiring connection to the main measurement device channels. This intermediary approach allows correction operations to proceed independently.
2Reliability
If a test fixture is connected to a measurement device for probe correction, then calibration can be performed, but the process becomes more complex and time-consuming
Solution Approach 1:
The probe correction functionality is extracted from the main measurement device operation. The TDR signal source and test fixture form an independent correction subsystem that can operate separately, reducing the complexity of the overall system while maintaining calibration capability.
Solution Approach 2:
Probe correction is performed as a preliminary action using TDR signals before main measurements begin. This preliminary calibration step ensures reliability without adding complexity to the main measurement process, as the correction is completed in advance.
3Measurement precision
If traditional probe correction methods are used requiring test fixture connection, then accuracy can be ensured, but adaptability and flexibility are reduced
Solution Approach 1:
The test fixture is designed with multi-functionality, serving both as a connection interface for the TDR signal source and as a platform for probe correction. This universal design allows the same fixture to handle both correction and measurement tasks, enhancing system flexibility while maintaining accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Ensures measurement efficiency and accuracy by allowing probe correction without the need for a connected test fixture, reducing errors and increasing flexibility in signal analysis and calibration.
Implementation Method 1
a time domain reflectometry signal source comprising at least one output port
Data Source
AI summary
A probe correction system is provided. Said probe correction system comprises a time domain reflectometry signal source comprising at least one output port. A test fixture comprises at least one probing point and at least one input port configured to be connectable to the at least one output port. A measurement device comprises at least one input channel. A probe under test comprises at least one probe input port configured to be connectable to the at least one probing point of the test fixture and at least one probe output port configured to be connectable to at least one input channel of the measurement device.