Probe Data Analysis for Scan Path Identification Without Machine Data
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Solution Overview
Problem
The existing methods for combining machine data and probe data from scanning probes in machine tools are inefficient, leading to increased cycle times and reduced throughput due to delays in data transfer and analysis, especially when large amounts of data are involved.
Innovation Solution
A method that identifies properties of the scan path used by a machine tool from characteristics of the collected probe data alone, allowing for analysis without needing data from the machine tool, thereby reducing cycle times and increasing throughput.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If probe data and machine data are combined and transferred to an external processing system for analysis, then measurement accuracy is improved, but cycle time increases and productivity decreases
Solution Approach 1:
The patent segments the data processing task by identifying and analyzing only the necessary portions of probe data independently, rather than requiring complete machine data transfer. This allows critical measurements to be processed separately from full machine data, reducing overall data transfer requirements and cycle time while maintaining measurement accuracy for the segmented analysis.
Solution Approach 2:
The patent performs preliminary analysis of probe data characteristics to identify scan path properties before complete machine data is available. By conducting initial data characterization and preliminary measurements on the probe data alone, the system reduces the amount of subsequent data transfer and processing needed, thereby reducing cycle time while preserving measurement capability.
2Loss of information
If machine data is transferred to an external processing system for probe data analysis, then accurate scan path identification is achieved, but data transfer time increases cycle time
Solution Approach 1:
The patent extracts and analyzes specific characteristic features from probe data that are sufficient for scan path identification, removing the requirement to transfer complete machine data. By extracting only the essential measurement characteristics needed for identification, the system achieves accurate scan path recognition while minimizing data transfer time and volume.
Solution Approach 2:
The patent creates simplified representations or copies of the essential scan path characteristics directly from probe data, rather than transferring and processing complete machine data. These data-derived copies contain sufficient information for accurate scan path identification but require minimal transfer time, resolving the contradiction between identification accuracy and transfer time.
3Reliability
If complete probe data sets are transferred and analyzed externally, then comprehensive workpiece inspection is achieved, but processing time and cycle time increase
Solution Approach 1:
The patent applies partial action by analyzing only the essential characteristics of probe data that are sufficient for comprehensive workpiece inspection, rather than processing complete data sets. By performing partial analysis on key measurement features, the system achieves reliable inspection results with significantly reduced processing time, eliminating the need for excessive data transfer and computation.
Data Source
Figure 1
Figure 2~3
Figure 4(a)~4(c)
AI summary
A method is described for analysing probe data collected by a scanning probe (4) carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe (4) along a scan path (P1, P2, P3, P4, P5, Q1, Q2) relative to a workpiece (6;40;140;240). The method comprises a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data.In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.