Scanning Probe Data Analysis for Machine Tool Scan Path Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing methods for combining machine data and probe data from scanning probes in machine tools are inefficient, leading to increased cycle times and reduced throughput due to delays in data transfer and analysis, especially when large amounts of data are involved, and often require external processing systems to understand the scan path, which can be slow or difficult to configure.
Innovation Solution
A method that analyzes probe data collected by a scanning probe to identify properties of the scan path without needing data from the machine tool, allowing for immediate analysis of probe data without waiting for machine data, thereby reducing cycle times and increasing throughput by recognizing characteristics such as stylus deflection patterns and variations in the probe data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If machine data and probe data are combined using external processing systems, then measurement accuracy is improved, but cycle time increases and productivity decreases
Solution Approach 1:
The patent segments the data processing workflow by separating probe data collection from machine data transfer. The external processing system receives only probe data via fast communication interfaces, while machine data is obtained separately through slower data links. This segmentation allows the time-consuming machine data transfer to occur independently without blocking the probe data analysis pipeline, thereby maintaining measurement accuracy while reducing overall cycle time.
Solution Approach 2:
The patent implements preliminary action by performing probe data collection and initial analysis before machine data transfer is complete. The external processing system can begin analyzing probe data immediately upon receipt, without waiting for machine data to be transferred. This preliminary analysis enables earlier identification of measurement results and potential issues, reducing the total cycle time while preserving measurement accuracy through subsequent integration with machine data.
2Measurement precision
If data is transferred to external processing systems for analysis, then measurement capability is improved, but time loss increases due to transfer and processing delays
Solution Approach 1:
The patent introduces an intermediary fast communication interface between the scanning probe and the external processing system. This intermediary allows probe data to be transmitted rapidly without going through the slower machine tool data links. The external processing system acts as an intermediary that can immediately process probe data while machine data is being transferred through the conventional slower interfaces, thereby reducing time loss without compromising measurement capability.
Solution Approach 2:
The patent ensures continuity of useful action by enabling the external processing system to continuously analyze probe data as it arrives, without interruption or waiting for machine data transfer to complete. This continuous analysis maintains measurement capability while minimizing idle time, as the processing system remains actively engaged in analyzing incoming probe data throughout the measurement process rather than experiencing delays from sequential data transfer operations.
3Productivity
If probe data is analyzed without machine tool data, then cycle time is reduced, but ability to interpret scan path context is worsened
Solution Approach 1:
The patent uses the external processing system as an intermediary that temporarily holds and analyzes probe data independently while machine data is being transferred. This intermediary approach allows cycle time to be reduced by not waiting for machine data, while the scan path context information from machine data is subsequently integrated to provide complete measurement interpretation. The intermediary system can perform preliminary analyses using only probe data, then refine results with machine data context.
Solution Approach 2:
The patent applies partial action by performing initial probe data analysis with incomplete information (without machine data), accepting that some contextual interpretation will be limited initially. This partial analysis provides rapid preliminary results that can be used immediately, while the missing scan path context is subsequently added when machine data becomes available. This approach prioritizes speed over complete contextual understanding in the initial phase, then compensates for the information gap later.
Data Source
AI summary
A method is described for analysing probe data collected by a scanning probe carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe along a scan path relative to a workpiece. The method includes a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data. In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.