Measuring Probe Defect Judging by Threshold Signal Comparison
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Solution Overview
Problem
Conventional measuring probes lack a reliable method to detect defects, leading to potential measurement inaccuracies and reduced reliability, as users may continue to use defective probes without realizing the issue, resulting in wasted measurements.
Innovation Solution
A defect judging unit is introduced, comprising a stylus with detection elements and a signal processing part that compares generated signals with predetermined thresholds to detect defects, featuring a signal amplifying part, offset correction, and a judged result output part to ensure measurement reliability with a simple configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional measuring probe is used without a defect detection system, then the device complexity is low, but the measurement reliability deteriorates as users may continue to use defective probes without awareness
Solution Approach 1:
The defect judging part performs preliminary defect detection by comparing the generated signal with a predetermined threshold before actual measurement takes place. This preliminary action identifies potential defects in the detection element, preventing unreliable measurements while keeping the system relatively simple through proactive rather than reactive monitoring.
2Reliability
If signal processing is performed to detect defects, then the measurement reliability is improved, but the device complexity increases due to additional signal processing requirements
Solution Approach 1:
The system performs partial signal processing by only comparing the generated signal with a predetermined threshold to detect defects, rather than performing complete signal analysis. This partial action approach provides sufficient defect detection capability while avoiding the complexity of comprehensive signal processing algorithms.
3Difficulty of detecting and measuring
If a defect judging part with threshold comparison is added, then the ability to detect defects is improved, but the device complexity increases due to additional components
Solution Approach 1:
The defect detection function is extracted as a separate defect judging part that independently compares the generated signal with a predetermined threshold. This extraction approach simplifies the overall system architecture by isolating the defect detection logic from the main measurement functionality, making the system easier to understand and maintain despite the added capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The defect judging unit effectively identifies defects in measuring probes, preventing inaccurate measurements and ensuring high reliability by outputting clear defect judgments, thus maintaining measurement precision and reliability.
Implementation Method 1
a detection element capable of detecting a movement of the contact part
Data Source
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AI summary
Defect judging unit (370) for a measuring probe (300) including: a stylus (336) having a contact part (362) to be in contact with an object (W) to be measured; four detection elements (325) capable of detecting a movement of the contact part (362); and a signal processing part (366) configured to process generated signals (Sg) obtained from outputs of the four detection elements (325) to output touch signals (Str). The defect judging unit includes a defect judging part (372) configured to compare four judged signals (Sh) corresponding to the generated signals (Sg) with predetermined thresholds (St) when the object (W) to be measured and the contact part (362) are out of contact with each other and judge that a defect exists if any of the judged signals (Sh) is greater than the predetermined threshold (St), and a judged result output part (390) configured to output a judged result of the defect judging part (372). According to this configuration, the defect judging unit of the measuring probe and the defect judging method thereof capable of ensuring measurement reliability with a simple configuration are provided.