Probe Pin Geometry and Dielectric Bushing for Millimeter-Wave Matching

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Solution Overview

Problem

Existing electrical coupling devices fail to achieve accurate impedance matching for high frequency signals, particularly millimeter waves, leading to transmission loss and inaccurate measurements.

Innovation Solution

A probe element comprising a conduction pin with a tip, intermediate, and socket portion, housed within a cylindrical barrel and bushing, where the bushing with higher permittivity than air is strategically positioned to reduce impedance differences and facilitate accurate impedance matching by varying the distances between the pin components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional pin terminal arrangement is used in a holder, then the device structure is simple, but impedance matching for high frequency signals is insufficient causing transmission loss

Engineering Contradiction:
Improveimpedance matching accuracyVSAvoidprobe element structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by creating different distance relationships in different regions of the probe element. Specifically, the distance between the socket portion and barrel is made different from the distance between the intermediate portion and barrel in the direction orthogonal to the barrel's extending direction. This localized geometric variation optimizes impedance matching at critical interfaces without requiring complete structural redesign.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent employs parameter changes by modifying the geometric parameters of the probe element, specifically the distances between components (socket portion to barrel, intermediate portion to barrel). By adjusting these dimensional parameters, the impedance characteristics are optimized for high frequency signal transmission, resolving the contradiction between simple structure and accurate impedance matching.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If impedance matching is not sufficient between pin terminal and coaxial cable, then the device structure remains simple, but transmission loss occurs and measurement accuracy decreases

Engineering Contradiction:
Improvehigh frequency signal measurement accuracyVSAvoidtransmission loss
Core Design Contradiction:
Measurement precisionVSLoss of energy

Solution Approach 1:

The patent addresses transmission loss by optimizing the local geometric quality at the interface between the conduction pin and barrel. By making the distance from the socket portion to the barrel different from the distance from the intermediate portion to the barrel, the patent creates favorable local impedance conditions that minimize reflection and transmission loss, thereby improving measurement precision for high frequency signals.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent reduces transmission loss through parameter changes in the geometric configuration, specifically by adjusting the orthogonal distances between key components. These parameter modifications optimize the electromagnetic field distribution and impedance continuity, reducing energy loss and improving the accuracy of high frequency signal measurements including millimeter waves.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The probe element effectively suppresses transmission loss and achieves high accuracy in measuring high frequency signals, including millimeter waves, by ensuring impedance matching across the frequency band, as demonstrated by reduced return loss up to 80 GHz.

Implementation Method 1

The bushing holds the conduction pin inside the barrel in a state in which the one end of the conduction pin is movable, and has predetermined permittivity

Methodology Applied
Scientific EffectPermittivity: Dielectric Permittivity

Data Source

PatentUS12085586B2Probe element and probe unit
Publication Date: 2024.09.10 MURATA MFG CO LTD
  • US12085586B2 patent drawing
  • US12085586B2 patent drawing

AI summary

A probe element includes a conduction pin, a cylindrical barrel, and a bushing. The barrel accommodates the conduction pin inside thereof such that the tip portion of the conduction pin is exposed to the outside. The bushing holds the conduction pin inside the barrel in a state in which the tip portion is movable, and has predetermined permittivity. The conduction pin includes a tip portion, an intermediate portion partially accommodating the tip portion, and a cylindrical socket portion coupled to the intermediate portion. A distance between the socket portion and the inner wall surface of the barrel, and a distance between the intermediate portion and the inner wall surface of the barrel in a direction orthogonal to an extending direction of the barrel are different from each other.