Electric Connection Device Probe Guide Plate Cost Reduction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The manufacturing cost of electric connection devices increases with the number of guide plates in the probe head, particularly due to the cost of forming through-holes for multiple probes, which becomes significant with a large number of probes.
Innovation Solution
The electric connection device employs a probe with a tubular barrel, rod-like top- and bottom-side plungers, and a reduced number of guide plates, where the probe is supported by a single support guide plate with a protrusion having a larger outer diameter than the barrel, allowing the probe to be held with fewer guide plates and enabling the use of thicker tips for enhanced contact and stress distribution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple guide plates are used in the probe head to hold probes, then the probes are securely supported, but the manufacturing cost increases due to the need to form through-holes in each guide plate
Solution Approach 1:
The patent combines the functions of multiple guide plates into a single guide plate structure. The probe head includes only one guide plate that integrates the support and positioning functions that would traditionally require multiple separate guide plates, thereby reducing the number of through-holes needed and lowering manufacturing costs while maintaining probe support stability
Solution Approach 2:
The single guide plate is designed to perform multiple functions simultaneously: it supports the probes, positions them accurately, and provides structural rigidity to the probe head. This multi-functional design eliminates the need for multiple specialized guide plates, reducing manufacturing complexity and cost
2Adaptability or versatility
If a large number of probes are used to measure characteristics of inspection subjects, then measurement capability increases, but the manufacturing cost especially increases with the number of guide plates
Solution Approach 1:
The patent merges the support structure for multiple probes into a single integrated guide plate rather than using separate guide plates for each probe. This allows the system to accommodate a large number of probes while avoiding the exponential increase in manufacturing cost that would result from adding multiple guide plates for each probe
3Ease of manufacture
If fewer guide plates are used to reduce manufacturing cost, then manufacturing cost decreases, but the probe support stability may be compromised
Solution Approach 1:
The single guide plate is designed with segmented functional zones: a support section with through-holes for probe insertion, a positioning section with protrusions for lateral positioning, and a reinforcement section with ribs for structural stability. This segmentation allows one guide plate to perform the functions of multiple guide plates, maintaining support stability while reducing manufacturing cost
Solution Approach 2:
The guide plate incorporates composite structural elements including reinforcing ribs and protrusions that provide additional structural support and positioning functionality. These composite features enhance the mechanical strength and stability of the single guide plate, compensating for the reduced number of guide plates
Data Source
AI summary
An electric connection device includes a probe (10) and a probe head (20). The probe (10) includes: a tubular barrel (11), a rod-like top-side plunger (121), and a rod-like bottom-side plunger (122). The top- and bottom-side plungers are connected to the barrel (11) with tips thereof exposed from respective open ends of the barrel (11). The probe head (2) includes guide plates (211 and 212) which are spaced apart from each other in the axial direction of the probe (10) and each include a through-hole through which a body of the barrel (11) penetrates. A protrusion (13) having an outer diameter greater than the body of the barrel (11) is provided on the circumference of the probe (10). The guide plates (211 and 212) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (13). The probe (10) is supported by the support guide plate with the top-side plunger (121) up such that the lower section of the protrusion (13) is in contact with the edge of the upper opening of the through-hole of the support guide plate.