Probe Head Lock Ring Securing Mechanism for Wafer Testing
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Solution Overview
Problem
Existing probe assemblies for wafer testing face challenges in efficiently securing and changing probe head assemblies without causing wear or debris, which can impact testing yield and efficiency.
Innovation Solution
A probe assembly with a lock ring securing mechanism that includes a rotatable lock ring housed within a lock ring housing, allowing for tool-free securement and release of the probe head assembly, preventing wear on fasteners and minimizing debris during testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional fastening mechanisms are used to secure the probe head assembly, then the probe head can be securely attached, but wear and debris are generated on the fasteners which impacts testing yield and efficiency
Solution Approach 1:
The patent removes traditional fasteners (screws, clips, or other securing mechanisms) from the probe assembly. Instead, a probe head assembly is inserted through a lock ring that secures it in place without contact from moving fastening parts. This extraction of fastening components eliminates the source of wear and debris generation while maintaining secure attachment of the probe head assembly.
2Ease of operation
If traditional fastening mechanisms are used to secure the probe head assembly, then the probe head can be securely attached, but the process of securing and changing probe heads becomes time-consuming and complex
Solution Approach 1:
The lock ring is pre-configured with a locking mechanism that automatically engages when the probe head assembly is inserted. The retainer arm is positioned to engage with the probe head assembly's corresponding feature, creating an automatic lock upon insertion. This preliminary positioning of locking components eliminates the need for manual fastening operations, significantly reducing the time and complexity of securing probe heads.
Solution Approach 2:
The securing mechanism is divided into distinct functional segments: the lock ring structure, the retainer arm, and the engagement features on the probe head assembly. This segmentation allows each component to perform its specific function independently - the lock ring provides the securing structure, the retainer arm provides the locking action, and the probe head assembly provides the engagement interface. This modular approach simplifies the overall operation and enables quick release by disengaging individual segments.
Data Source
AI summary
Methods and apparatus are described relating to a probe assembly having a probe head securing mechanism that includes a lock ring housing and a lock ring disposed in the lock ring housing. In an example, a probe assembly includes a rigid substrate, a circuit board coupled to the rigid substrate, and a probe head securing mechanism. The probe head securing mechanism includes a lock ring housing and a lock ring disposed within the lock ring housing. The circuit board has a surface. The lock ring housing is coupled to the rigid substrate. The circuit board is disposed between the lock ring housing and the rigid substrate. The lock ring is rotatable relative to the lock ring housing. Rotation of the lock ring is configured to move the lock ring in a direction perpendicular to the surface of the circuit board.