Probe Head Guide Holes Offset to Reduce Probe Scratching
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Solution Overview
Problem
The side surfaces of probes are prone to scratching and damage due to the sliding action within guide holes in the probe head during contact and non-contact states with the inspection object, leading to probe degradation.
Innovation Solution
The electrical connecting device features a probe design with a narrow part on its side surface, positioned away from the maximum stress area, which allows the probe to bend and slide within the guide holes parallel to the center line, reducing contact with the guide hole edges and minimizing damage. The probe head includes a top, middle, and bottom guide plate arrangement with offset guide holes, facilitating stable contact and reducing wear.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If probes are inserted through guide holes in guide plates to enable stable contact with inspection object, then measurement reliability is improved, but probe side surfaces are scratched and damaged during sliding
Solution Approach 1:
A guide post is introduced as an intermediary component between the probe and the guide hole. The guide post fits within the guide hole and provides a smooth guiding surface, while the probe slides along this protected surface rather than directly against the guide hole edges, preventing probe damage during insertion and retraction cycles
Solution Approach 2:
The guide hole geometry is modified by adding a guide post with specific dimensional parameters (diameter, length) that change the interaction between the probe and guide hole. The guide post creates a controlled sliding interface that reduces harmful contact while maintaining the necessary guiding function for stable probe positioning
2Stability of the object's composition
If guide holes are positioned at different locations in top and middle guide plates to bend probes, then stable contact pressure is achieved, but probe sliding damage increases
Solution Approach 1:
The guide post serves as a mediator that enables the bent probe configuration while protecting the probe from damage. It allows the guide holes to be positioned at different locations for bending the probe while providing a smooth surface that prevents scratching during the sliding motion required for contact and retraction
Data Source
AI summary
An electrical connecting device includes probes, and a probe head including a middle guide plate arranged between a top guide plate and a bottom guide plate and closer to the bottom guide plate so as to lead the probes to penetrate therethrough. The top guide plate and the middle guide plate are provided with guide holes through which the probes are inserted at positions shifted between the top guide plate and the middle guide plate so as to lead the probes to be held in a bent state between the top guide plate and the middle guide plate. The probes have a structure easier to bend at a region excluding a maximum stress part than at the maximum stress part defined at a position at which a maximum stress is applied to the probes buckled when tip end parts of the probes are brought into contact with an inspection object.