Inspection Probe Electrical Isolation for Noise Reduction
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Solution Overview
Problem
Existing inspection apparatuses for liquid crystal panels suffer from noise-induced measurement variations due to capacitive coupling between probe styluses and signal circuit substrates, which can lead to inaccurate results.
Innovation Solution
The inspection apparatus electrically isolates the probe assembly from the support base member using insulating members, preventing capacitive coupling and reducing noise interference, while maintaining electrical connectivity through the housing to ground.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the probe assembly is electrically connected to the support base member and ground, then electrical connectivity is ensured, but noise-induced measurement variations occur due to capacitive coupling
Solution Approach 1:
The support base member is divided into two electrically isolated parts: a first support base member connected to ground and a second support base member supporting the probe assembly. This segmentation breaks the electrical connection path while maintaining mechanical support, thereby eliminating capacitive coupling noise while preserving ground connectivity for the housing.
Solution Approach 2:
An insulating member is introduced as an intermediary between the first and second support base members. This insulating member prevents direct electrical connection between the grounded portion and the probe assembly portion, blocking the noise transmission path through capacitive coupling while allowing mechanical support to be transmitted.
2Measurement precision
If the probe assembly is electrically isolated from the support base member, then noise effects are reduced, but structural support and stability may be compromised
Solution Approach 1:
The insulating member serves as a mediator that provides both electrical isolation and mechanical support. It is positioned between the first and second support base members to prevent electrical connection while maintaining the structural framework that supports the probe assembly, thereby achieving noise reduction without compromising structural stability.
Solution Approach 2:
The insulating member is strategically positioned only at the critical interface where electrical isolation is needed between the grounded support base and the probe assembly support, while other parts of the structure maintain their conductive and supportive properties. This localized application of insulation preserves overall structural integrity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively reduces noise effects, ensuring accurate and reliable inspections by minimizing current leaks and maintaining a low-noise environment, allowing for precise measurement without increasing sampling requirements.
Implementation Method 1
the probe assembly and the support base member are electrically isolated from each other
Data Source
AI summary
An inspection apparatus capable of reducing the effect of noises is provided. An inspection apparatus according to the present invention includes a work table 26 on which an object, a fixed body 28 disposed above the work table 26, a probe assembly that holds a probe stylus 38a, a support base member 40 supported on the fixed body 28, a suspension mechanism 46 that supports the probe assembly 38 above the work table 26, and a signal circuit substrate 54 including therein an IC chip 54a that generates an inspection signal supplied to the probe stylus 38a, the signal circuit substrate 54 being supported by the suspension mechanism 46 below the suspension mechanism 46, in which the probe assembly 38 and the support base member 40 are electrically isolated from each other.