Probe Contact Liner Composition to Prevent C4 Adhesion

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Solution Overview

Problem

Existing IC device testers face challenges with residual C4 material adhering to probe contacts, leading to contamination and frequent replacement of probe cards, which affects testing efficiency and longevity.

Innovation Solution

A conductive glass matrix liner composed of glass and metal particles is applied to probe contacts, allowing for efficient electrical current transmission while preventing C4 material adhesion, thereby reducing contamination and extending probe card lifespan.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional probe contact is used, then electrical current transmission is achieved, but C4 material adheres to the probe contact causing contamination

Engineering Contradiction:
Improveelectrical current transmissionVSAvoidC4 material adhesion
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The probe contact is coated with a composite material consisting of glass particles (5-50 mass%) and metal particles (50-95 mass%). The glass particles prevent C4 material adhesion while the metal particles maintain electrical conductivity, resolving the contradiction between preventing contamination and ensuring current transmission.

Inventive Principle:
Principle #40Composite materials

2Reliability

If the probe card is replaced frequently due to contamination, then testing reliability is maintained, but productivity decreases

Engineering Contradiction:
Improvetesting reliabilityVSAvoidtesting efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The conductive glass matrix liner provides self-cleaning properties by preventing C4 material adhesion in the first place. The glass particles create a surface that resists contamination, eliminating the need for frequent probe card replacements and maintaining both reliability and productivity.

Inventive Principle:
Principle #25Self-service

3Reliability

If a conductive coating is applied to improve electrical transmission, then conductivity increases, but C4 material adhesion worsens

Engineering Contradiction:
Improveelectrical conductivityVSAvoidcontamination
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

Instead of using a purely conductive metal coating that attracts C4 material, the invention uses a composite of glass and metal particles. The glass matrix provides a non-stick surface while embedded metal particles provide conductivity pathways, achieving both goals simultaneously.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The surface properties are made non-uniform at the particle level: glass particles provide anti-adhesion properties while metal particles provide conductivity. This local differentiation of material properties allows the surface to simultaneously resist contamination and conduct electricity.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The conductive glass matrix liner enables effective electrical pathways while minimizing residual material adherence, enhancing the durability and reliability of IC device testers by reducing the need for frequent probe card replacements.

Implementation Method 1

The liner includes a matrix of an electrical conductor and glass. The metal particles of the liner allow the contact probe to pass an electrical current through the liner.

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS11009545B2Integrated circuit tester probe contact liner
Publication Date: 2021.05.18 INTERNATIONAL BUSINESS MACHINE CORPORATION
  • US11009545B2 patent drawing
  • US11009545B2 patent drawing
  • US11009545B2 patent drawing

AI summary

An integrated circuit (IC) device tester includes contact probes. A liner is formed upon the contact probes. The liner includes a matrix of metal particles and glass particles. The metal particles of the liner allow the contact probe to pass an electrical current through the liner. The glass particles of the liner prevent C4 material from adhering to the liner.