Probe Module Recalibration for Accurate DUT Testing
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Solution Overview
Problem
Existing testing systems fail to provide accurate results when probe sets are replaced, as the original compensation information is no longer applicable, leading to inconsistent calibration and test outcomes.
Innovation Solution
A method involving a test machine and a probe module with two interchangeable probe sets, where calibration is performed immediately after each probe set replacement, ensuring accurate test results by reconnecting and recalibrating the system for each probe set.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If calibration is only done during initialization, then the testing system operates efficiently with fewer calibration steps, but the test results become inaccurate when probe sets are replaced
Solution Approach 1:
The calibration plate is pre-configured with multiple calibration patterns (through-holes, pads, traces) that can accommodate different probe sets. This preliminary preparation allows rapid recalibration when probe sets are replaced, eliminating the need for extensive recalibration procedures while maintaining measurement accuracy.
Solution Approach 2:
The system automatically adjusts calibration parameters based on the specific probe set being used. When a probe set is replaced, the system retrieves or selects appropriate calibration data corresponding to that probe set's characteristics (measuring distance, probe tip geometry), enabling accurate measurements without manual recalibration of all parameters.
2Adaptability or versatility
If the same probe set is used for all tests, then calibration information remains valid, but the system lacks adaptability to different test requirements and measuring distances
Solution Approach 1:
The calibration plate is designed with universal calibration patterns that can serve multiple probe sets with different measuring distances and configurations. The plate includes various pad sizes, trace patterns, and through-holes that can be used for calibrating different types of probes, making the calibration infrastructure universal rather than probe-specific.
Solution Approach 2:
The calibration plate acts as an intermediary standard between the probe sets and the DUT. It provides a known reference structure that mediates the calibration process, allowing different probe sets to be calibrated against the same physical standard without requiring direct comparison between probes or complex cross-calibration procedures.
3Adaptability or versatility
If probe sets are replaced frequently to meet different test demands, then the system becomes more versatile, but the original compensation information becomes invalid requiring recalibration
Solution Approach 1:
The system incorporates feedback mechanisms where the calibration status and compensation information are automatically updated when probe sets are replaced. The testing system detects probe set changes and triggers appropriate recalibration routines, ensuring that compensation information remains current and accurate for the active probe set, thereby maintaining reliability despite frequent changes.
Solution Approach 2:
Calibration data for multiple probe sets is pre-acquired and stored in the system memory before actual testing begins. When a probe set is replaced, the system can immediately retrieve the pre-stored calibration information for that specific probe set, eliminating the need for time-consuming recalibration while ensuring calibration consistency and reliability.
Data Source
AI summary
A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.