Probe Illumination via Optical Waveguides for Contact Visibility

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Solution Overview

Problem

Existing probes or measuring heads face challenges in establishing safe and convenient contact with miniaturized circuit structures and in poor lighting conditions, particularly when accessing inaccessible circuit elements.

Innovation Solution

The probe or measuring head incorporates a light source to illuminate the contact region and surrounding environment, using optical waveguides, recesses, and light-scattering layers to achieve targeted or diffuse lighting, and may include color-coded LEDs to indicate electrical potential, with optional magnification using an optical lens and miniaturized camera for automated testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If a light source is integrated into the probe or measuring head, then visibility of the contact region and test environment is improved, but device complexity increases

Engineering Contradiction:
Improvevisibility of contact regionVSAvoidstructure of probe
Core Design Contradiction:
Illumination intensityVSDevice complexity

Solution Approach 1:

The patent combines the light source, optical waveguides, and measurement functionality into a single integrated probe or measuring head assembly. This merging of illumination and measurement functions into one device improves visibility of the contact region while maintaining a compact form factor suitable for electronic circuit testing.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The probe or measuring head serves multiple functions simultaneously: it provides electrical contact for signal measurement and delivers optical illumination to the contact region. This multi-functionality eliminates the need for separate illumination equipment, improving visibility without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Illumination intensity

If optical waveguides are used to guide light to the probe tip, then light intensity at the contact region is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improvelight intensity at probe tipVSAvoidalignment of optical waveguides
Core Design Contradiction:
Illumination intensityVSManufacturing precision

Solution Approach 1:

The patent employs optical waveguides with specific local optical properties (refractive index, geometry) that are optimized for light guidance. The waveguides are positioned and configured with precise local characteristics to efficiently channel light from the source to the contact region, maximizing light intensity delivery while managing manufacturing tolerances.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures reliable and visible contact in miniaturized and poorly lit environments, enhancing the accuracy and efficiency of electrical signal measurement by improving visibility and allowing for automated error detection.

Implementation Method 1

the light rays of a light source positioned in this manner are preferably guided via optical waveguides, preferably synthetic-material optical waveguides, towards the probe tip or measuring tip of the probe or measuring head

Methodology Applied
Scientific EffectOptical waveguide: Waveguide (optics)

Implementation Method 2

If diffuse lighting is required in the region of the probe tip or measuring tip, a light-scattering layer is preferably attached either to the end of the insulating layer facing the probe tip or measuring tip or inside the recesses in the housing of the probe or measuring head

Methodology Applied
Scientific EffectLight scattering: Scattering

Data Source

PatentUS7868634B2Probe or measuring head with illumination of the contact region
Publication Date: 2011.01.11 ROHDE & SCHWARZ GMBH & CO KG
  • US7868634B2 patent drawing
  • US7868634B2 patent drawing
  • US7868634B2 patent drawing

AI summary

A probe or measuring head for measuring an electrical signal of an electrical contact has an electrically conducting feeler (1) which protrudes out of a housing (3) and has, at its end, a contact region (4) which comes into touching contact with the electrical contact. The contact region (4) of the feeler (1) and the measurement environment surrounding the contact region (4) of the feeler (1) is illuminated by the light beams from a light source (101, 102, . . . , 10n, 10o) connected to the probe or measuring head.