Probe Path Filtering for Faster Part Alignment and Surface Inspection
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Solution Overview
Problem
Current manufacturing systems face inefficiencies in determining optimal probe points for surface inspection and part alignment in additive and subtractive manufacturing, leading to increased measurement time and reduced accuracy due to excessive sampling of unnecessary points.
Innovation Solution
A method to filter an initial set of probe points by selecting only the minimum number required to meet accuracy thresholds, ensuring points are spread across the part and aligned with manufacturing axes, using vector alignment and voxelization to optimize the set for reduced degrees of freedom, thereby reducing the number of probe points needed for alignment and inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a large number of probe points are sampled for surface inspection and part alignment, then measurement accuracy is improved, but measurement time increases
Solution Approach 1:
The patent extracts and removes redundant probe points from the initial set, keeping only the essential points needed for accurate alignment and inspection. The filtering process identifies and eliminates unnecessary sampling points while preserving the minimum set required to meet accuracy thresholds, directly resolving the contradiction between comprehensive sampling and measurement efficiency
Solution Approach 2:
The patent changes the parameter of probe point quantity from excessive to optimized minimum. By dynamically determining the minimum number of points required based on accuracy thresholds and part geometry, the system transforms the measurement approach from brute-force comprehensive sampling to precision-targeted sampling, achieving both accuracy and time efficiency
2Measurement precision
If probe points are densely distributed across the part, then coverage and accuracy are improved, but the number of measurements and time required increase
Solution Approach 1:
The patent applies local quality by distributing probe points non-uniformly across the part surface, concentrating points in regions requiring higher inspection accuracy while reducing density in less critical areas. This localized optimization ensures adequate coverage and accuracy where needed while maintaining overall inspection efficiency
Solution Approach 2:
The patent uses partial action by sampling only the necessary portion of the part surface rather than uniformly dense sampling across the entire surface. The system determines the minimum sufficient sampling density required to meet accuracy thresholds, avoiding excessive measurements in regions where full density is not necessary
3Reliability
If an initial large set of probe points is generated, then sufficient data for alignment is obtained, but the complexity of processing and filtering increases
Solution Approach 1:
The patent performs preliminary action by pre-filtering and organizing probe points during the initial generation phase. The system applies filtering criteria and voxelization early in the process to reduce the dataset before detailed alignment computations, simplifying subsequent processing while ensuring alignment reliability is maintained
4Measurement precision
If more probe points are used for part alignment, then alignment accuracy is improved, but the computational resources and time required increase
Solution Approach 1:
The patent extracts the essential subset of probe points needed for accurate alignment, removing redundant points that would consume computational resources without contributing to alignment precision. This extraction process directly reduces computational energy requirements while preserving alignment accuracy
Data Source
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AI summary
Methods, systems, and apparatus, including medium-encoded computer program products, for automatic generation of probe path for surface inspection and part alignment. A mesh model is obtained of at least a portion of a three dimensional model of a part to be manufactured using a computer-controlled manufacturing system. Vertex points from the mesh model are collected to be an initial set of probing points in a three dimensional space of a working coordinate system of the computer-controlled manufacturing system, and filtering out points are filtered out from the initial set of probing points based on coverage of the least a portion of the three dimensional model to produce a final set of probing points. The final set of probing points is provided for use in alignment or surface inspection of the part by the computer-controlled manufacturing system.