Probe Peripheral Assembly for Low-Temperature NDT
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Solution Overview
Problem
Existing non-destructive testing devices and methods are not suitable for low temperature environments, particularly for superconducting magnets used in magnetic confinement nuclear fusion devices, as they either fail to operate effectively or suffer permanent damage at temperatures below their minimum operating temperature.
Innovation Solution
A non-destructive testing device and method that includes an excitation component, acquisition component, and a probe surrounded by a probe peripheral assembly forming a temperature-controlled first space, using ultrasonic or electromagnetic signals, with a temperature control assembly to maintain the probe within an appropriate temperature range (10°C to 70°C) and isolate it from external environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing non-destructive testing devices are used in low temperature environments, then the testing can be performed, but the device performance is affected and permanent damage occurs
Solution Approach 1:
The system is divided into two temperature zones: the probe operates in a controlled temperature environment (10°C to 70°C) while the workpiece is tested at low temperatures. The probe peripheral assembly creates a thermal barrier that segments the temperature conditions, allowing the probe to remain in its optimal operating range while testing cold workpieces.
Solution Approach 2:
The probe peripheral assembly acts as an intermediary thermal barrier between the probe and the low temperature environment. This intermediate structure protects the probe from direct exposure to extreme cold while still allowing it to perform non-destructive testing on cold workpieces.
2Reliability
If the probe is isolated from external environment, then thermal isolation is achieved, but device complexity increases
Solution Approach 1:
The probe peripheral assembly creates a distinct isolated space around the probe, segmenting it from the external low temperature environment. This spatial segmentation achieves thermal isolation without requiring complex active control systems.
Solution Approach 2:
The probe peripheral assembly with heating elements provides self-contained thermal management for the probe. The system automatically maintains the probe temperature within the optimal range through integrated heating and insulation, reducing the need for external temperature control infrastructure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables safe and effective non-destructive testing of superconducting magnets and conductors at low temperatures, ensuring the probe operates within its optimal temperature range and maintaining thermal isolation.
Implementation Method 1
the temperature control element is arranged on the probe cover, is connected with the excitation component and the acquisition component, is capable of generating heat by excitation of the excitation component
Implementation Method 2
the probe peripheral assembly surrounds the probe, so that a first space that isolates the probe from an external environment is formed at a periphery of the probe
Data Source
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AI summary
A non-destructive testing device (10) and a non-destructive testing method. The non-destructive testing device (10) comprises an excitation component (11), an acquisition component (12) and a probe (13), and the excitation component (11) is connected to the probe (13), and supplies energy to the probe (13); the probe (13) transmits a first signal to a workpiece (15) to be tested and receives a second signal corresponding to the first signal; the acquisition component (12) is connected to the probe (13), and acquires the first signal and the second signal from the probe (13); and the non-destructive testing device (10) further comprises a probe peripheral assembly (14), and the probe peripheral assembly (14) surrounds the probe (13), so that a first space that isolates the probe (13) from an external environment is formed at the periphery of the probe (13). The non-destructive testing device (10) is suitable for the simple and easy non-destructive testing of low-temperature environments and non-destructive testing of superconducting magnets.