Probe Pin Alignment Device with Mirror Reflection
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Solution Overview
Problem
Existing probe pin alignment systems for electronic devices, such as liquid crystal display and semiconductor elements, face challenges in accurately aligning probe pins with electrode pads, leading to inefficient inspection and transfer processes due to misalignment issues.
Innovation Solution
A probe pin alignment device that includes a mirror for reflecting the electrode pad image, a camera for capturing the probe pin and mirror image, a deviation measurer for calculating positional discrepancies, and a controller to adjust the base and probe pin position, ensuring precise alignment by relative displacement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a mirror and camera system is used to visualize probe pin contact positions, then observation accuracy is improved, but device complexity increases
Solution Approach 1:
A mirror is introduced as an intermediary component to reflect the contact position between the probe pin and electrode pad, enabling the camera to capture the alignment state indirectly. This mediator allows observation without direct line-of-sight access to the contact point, improving measurement precision while maintaining relatively simple device architecture.
Solution Approach 2:
The mirror creates an optical copy (reflection) of the contact position, allowing the camera to capture an image of the alignment state without physically interfering with the probe pin or electrode pad. This copying mechanism enables accurate observation while keeping the measurement system non-intrusive and relatively simple.
2Manufacturing precision
If real-time alignment adjustment is implemented, then alignment accuracy is improved, but processing time increases
Solution Approach 1:
The alignment adjustment is performed preliminarily before the probe pin makes contact with the electrode pad. The camera captures the approaching positions, the deviation is calculated, and the displacer pre-adjusts the probe pin position to minimize contact deviation. This preliminary action ensures high alignment accuracy without requiring time-consuming adjustments during the actual contact process.
Solution Approach 2:
A feedback loop is established where the camera continuously monitors the relative positions of the probe pin and electrode pad during approach, the deviation measurer calculates the positional discrepancy in real-time, and the controller adjusts the displacer accordingly. This closed-loop feedback enables dynamic alignment correction that maintains high accuracy while minimizing processing time through automated real-time control.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves real-time position alignment of probe pins with electrode pads, enhancing the efficiency of inspection and transfer processes by accurately correcting deviations, thereby improving the accuracy and reliability of the alignment.
Implementation Method 1
a mirror configured to reflect a mirror image of at least the electrode pad of the electronic device
Data Source
AI summary
Provided is a probe pin alignment device that can readily correct a positional deviation between a probe pin and an electrode pad in real time and can prevent damage to the probe pin or an electronic device. The probe pin alignment device includes a mirror to reflect a mirror image of the electrode pad while the probe pin is approaching a crystal oscillator, a camera to take a picture containing an image of the probe pin and the mirror image reflected on the mirror, a deviation measurer to measure a deviation between the position of the probe pin and the position of the electrode pad in the taken picture, a displacer to relatively displace a carrier and the probe pin, and a controller to cause the displacer to relatively displace the carrier and the probe pin such that the deviation is substantially zero.