Multi-Layer Probe Pin Cleaning Pad for Scratch Reduction
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Solution Overview
Problem
Probe pins used in electronic component testing often suffer from impurities and scratches, which can affect test results, and existing cleaning methods fail to effectively address these issues without causing further damage.
Innovation Solution
A probe pin cleaning pad comprising a release layer, adhesive layer, substrate layer, cleaning layer, and polishing layer, where the cleaning layer has a Mohs hardness of less than 7 and a Young's modulus of less than or equal to 100 kg/cm2, and the polishing layer includes inorganic particles, is used to clean probe pins, reducing scratches and improving cleaning efficacy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional cleaning methods are used on probe pins, then cleaning action is provided, but scratches are caused on the probe pin surface
Solution Approach 1:
The cleaning pad is segmented into multiple functional layers: a polishing layer with harder particles for removing impurities, and a cleaning layer with softer particles for gentle cleaning. This segmentation allows different layers to perform different functions, with the polishing layer doing the heavy lifting and the cleaning layer providing gentle finishing to prevent scratches.
Solution Approach 2:
The patent changes the hardness parameter of particles in different layers. The polishing layer contains inorganic particles with higher hardness for effective impurity removal, while the cleaning layer contains organic particles with lower hardness (Mohs hardness less than 7) to prevent scratches during the cleaning process.
2Productivity
If cleaning pads with high hardness particles are used, then cleaning efficacy is improved, but probe pin integrity is compromised
Solution Approach 1:
The cleaning pad is divided into two distinct layers with different particle hardness characteristics. The polishing layer handles the demanding task of removing tough impurities with high hardness particles, while the cleaning layer with low hardness particles provides a gentler action that preserves probe pin integrity.
Solution Approach 2:
Different regions of the cleaning pad have different local qualities in terms of particle hardness. The polishing layer has high hardness for effective cleaning, while the cleaning layer has low hardness for protective action. This local quality variation allows the pad to simultaneously achieve high cleaning efficacy and preserve probe pin integrity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The cleaning pad effectively adheres to and removes substances from probe pins, reducing scratches and improving the number of uses while maintaining the integrity of the probe pins, as demonstrated by experimental examples showing better surface flatness and adhesion compared to conventional methods.
Implementation Method 1
the cleaning layer is adapted to adhere to and cover a substance on the probe pin
Implementation Method 2
the polishing layer includes inorganic particles with a Mohs hardness of large than or equal to 7
Data Source
AI summary
A probe pin cleaning pad including a release layer or composite plate, an adhesive layer, a substrate layer, a cleaning layer, and a polishing layer is provided. The adhesive layer is disposed on the release layer or composite plate. The substrate layer is disposed on the adhesive layer. The cleaning layer is disposed on the substrate layer. The polishing layer is disposed on the cleaning layer. A cleaning method for a probe pin is also provided.