Electromagnetic Probe Positioning for Oversampling
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Solution Overview
Problem
Existing devices for measuring electromagnetic radiation patterns are limited by the discretized measurement step imposed by the arrangement of probes, constraining the size of the object being measured or the maximum measurement frequency, and lack flexibility in handling objects of varying sizes and shapes.
Innovation Solution
A device that allows relative displacement of the object and the array of electromagnetic probes in at least two degrees of freedom, enabling spatial over-sampling and presenting the object from different facets, with optional additional rotation for complete oversampling, using sliding and rotation means to multiply measurement points and expand the measurement frequency and object size capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a network of probes is arranged in a fixed configuration (arch, sphere, line, or plane), then the measurement structure is simple and easy to implement, but the number of measurement points is limited by the discretized arrangement, constraining the maximum measurement frequency and object size
Solution Approach 1:
The patent applies the dynamics principle by introducing relative motion between the probe array and the object under test. Instead of a static probe arrangement, the system enables continuous relative displacement along at least one direction and rotation around an axis, transforming the measurement process from a fixed discrete sampling to a dynamic continuous scanning approach. This allows the same physical probe array to effectively sample at multiple positions and angles, dramatically increasing the number of measurement points without adding more probes.
Solution Approach 2:
The patent applies the dimensionality change principle by adding rotational movement around an axis perpendicular to the displacement direction. This introduces a new dimensional degree of freedom, allowing the probe array to scan not only along a linear path but also angularly around the object. The combination of linear displacement and rotational motion creates a two-dimensional scanning surface, effectively transforming a one-dimensional probe array into a two-dimensional measurement system.
2Adaptability or versatility
If the probe array size and spacing are fixed, then the device structure is simplified, but this imposes constraints on the dimensions of the object under test and the maximum measurement frequency
Solution Approach 1:
The system uses dynamic positioning to achieve adaptability. By continuously displacing the probe array along a direction and rotating it around an axis, the same fixed-size probe array can adapt to measure objects of varying sizes and at different frequencies. The relative motion allows the probe array to effectively cover larger measurement volumes and maintain appropriate sampling density across different object dimensions and frequency ranges.
Solution Approach 2:
The patent implements universality by designing a positioning system that can handle multiple measurement scenarios with a single probe array configuration. The combination of linear displacement and rotational capabilities allows the same device to measure different object sizes, shapes, and electromagnetic characteristics without requiring reconfiguration of the probe array itself, making the system universally applicable to various measurement requirements.
3Measurement precision
If more probes are added to increase measurement points, then the measurement precision and coverage improve, but the device complexity, cost, and data processing burden increase
Solution Approach 1:
The patent applies dynamics by using temporal motion to create spatial sampling diversity. Instead of using more probes simultaneously, the system uses a smaller probe array that moves and rotates to sequentially sample different spatial locations. The relative displacement and rotation generate multiple effective measurement positions over time, achieving high sampling density with fewer physical probes by exploiting the time dimension.
Solution Approach 2:
The system uses dimensionality change by introducing rotational motion around an axis perpendicular to the displacement direction. This adds an angular dimension to the sampling process, allowing the probe array to effectively create a two-dimensional measurement grid from a one-dimensional probe arrangement. The rotation generates additional spatial sampling points without requiring a proportional increase in the number of probes.
Data Source
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Figure 3a~3b
AI summary
The invention relates to a device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200), wherein said device includes at least a means (301) for the relative sliding of the object being tested (200) and of the electromagnetic probe network (100), capable of moving the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which are provided a means (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.