Four-Probe Module With Pressure Feedback for Conductive Fiber Resistivity
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Solution Overview
Problem
Existing collinear four-probe arrays face challenges in ensuring consistent probe pressure and ohmic contact for conductive fiber materials, particularly for materials with varying diameters and roughness, leading to unreliable and unstable resistivity measurements.
Innovation Solution
A probe module with adjustable spring probes and real-time pressure feedback, along with an ohmic contact test, ensures uniform probe pressure and reliable contact before resistivity testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional four-probe array with fixed pressure springs is used, then the structure is simple, but the probe pressure cannot be adjusted individually, leading to inconsistent contact pressure and unreliable measurement results
Solution Approach 1:
The patent transforms the fixed pressure spring system into a dynamic, adjustable pressure control system. Each probe is equipped with an independent pressure adjustment mechanism that allows real-time modification of contact pressure, enabling the system to adapt to different material properties and maintain reliable measurements across varying conditions
Solution Approach 2:
The invention implements independent pressure parameter control for each probe through adjustable pressure springs and threaded adjustment mechanisms. This allows individual optimization of contact pressure for each probe tip, ensuring consistent ohmic contact across all probes while maintaining measurement reliability
2Adaptability or versatility
If the probe pressure adjustment range is limited, then the device structure is simple, but the stretching range of probes is small, causing material applicable range problems for materials with high roughness
Solution Approach 1:
The patent implements a dynamic pressure adjustment system with a wide adjustment range, allowing probes to adapt to materials with varying roughness and diameter. The adjustable pressure springs and threaded mechanisms enable real-time modification of probe contact force, expanding the material applicable range while maintaining measurement accuracy
Solution Approach 2:
The invention provides broad pressure parameter adjustment capability through independent control of each probe's contact pressure. The pressure adjustment range is optimized to accommodate different material properties, including high roughness surfaces, by allowing significant variation in contact force without requiring complex multi-component systems
3Measurement precision
If ohmic contact verification is not performed, then the testing process is simple and fast, but the test result is unreliable due to unknown contact quality between metal probe and semiconductor film material
Solution Approach 1:
The patent incorporates ohmic contact verification as a preliminary step before the main resistivity measurement. This pre-check ensures that proper ohmic contact is established between the metal probes and semiconductor film material, preventing unreliable measurements and reducing the need for repeat testing, thereby improving overall measurement accuracy
Solution Approach 2:
The invention implements a feedback mechanism through ohmic contact verification that provides information about contact quality. By measuring and evaluating the contact characteristics before the main measurement, the system can identify and correct contact issues, ensuring accurate resistivity measurements while managing testing time through systematic verification
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The module provides accurate and stable resistivity measurements by adjusting probe pressure within a large range and verifying ohmic contact, improving measurement consistency and accuracy.
Implementation Method 1
one end of the pressure spring is abutted against the top of the gland spring holes, and the other end of the pressure spring is in contact with the conductive sheet
Implementation Method 2
the pressure sensor is in contact with the conductive sheet, and both of them are sleeved on an upper part of the spring probe
Implementation Method 3
the other end of the pressure spring is in contact with the conductive sheet... the conductive sheet, and both of them are sleeved on an upper part of the spring probe
Data Source
AI summary
A probe module for testing the resistivity of a conductive fiber material includes four gland spring holes in the upper end gland are uniformly formed in the bottom surface of the gland main body; one end of a pressure spring is abutted against the top of the gland spring holes, and the other end of the pressure spring contacts a conductive sheet; an outer wall of a probe frame is of an external thread structure which is matched with an internal thread structure of an internal threaded hole and threadably secured thereto; the probe frame is internally provided with a spring probe; a pressure sensor contacts the conductive sheet, and both are sleeved on an upper part of the spring probe; and the top end of the spring probe is in contact with the pressure spring, and the bottom end of the spring probe contacts a conductive fiber material sample.