Probe Recess Structure for Stable Small-Component Measurement
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Solution Overview
Problem
Existing measuring devices struggle to stably measure the electrical characteristics of small components due to inadequate gripping and positioning.
Innovation Solution
The measuring device incorporates a recessed portion in at least one of the pair of probes to accommodate a part of the component, allowing for stable gripping and fixed positioning, thereby enabling accurate electrical characteristic measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional probes without recessed portions are used to grip components, then the device structure remains simple, but the gripping stability and measurement accuracy deteriorate when components are small
Solution Approach 1:
The probe is designed with a recessed portion at its tip that provides a customized fitting surface matching the component's geometry. This local structural modification creates optimal contact areas for gripping small components, improving measurement accuracy without significantly complicating the overall probe design.
Solution Approach 2:
The recessed portion adds a depth dimension to the probe tip surface, transforming it from a flat two-dimensional contact surface to a three-dimensional cavity that accommodates the component. This dimensional enhancement allows for more precise positioning and stable gripping of small components.
2Adaptability or versatility
If the component size is reduced, then the measurement capability is enhanced, but the gripping stability deteriorates due to insufficient contact area
Solution Approach 1:
The recessed portion creates localized contact zones within the cavity that are specifically designed to match the component's footprint. This ensures adequate contact area even for small components, maintaining gripping stability while enabling measurement of reduced-size components.
Solution Approach 2:
The recessed portion is pre-formed in the probe structure to anticipate and accommodate small components before measurement begins. This preliminary geometric preparation ensures that when small components are placed on the probe, they are automatically positioned and secured with appropriate contact areas.
Data Source
AI summary
This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, a recessed portion capable of accommodating at least a part of the components is provided in at least one of the pair of probes that grips the components. As described above, since a part of the components is accommodated in the recessed portion, it is possible to obtain at least one of the following: it is possible to more favorably grip the component by the pair of probes, and it is possible to grip the component at a fixed position by the pair of probes. As a result, it is possible to stably measure the electrical characteristic of the component.


