Probe High-Rigidity Portion Abrasion Resistance
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Solution Overview
Problem
Probes in electrical connection devices for measuring electrical characteristics of inspection objects suffer damage due to sliding through guide holes, causing side surface abrasion and potential peeling.
Innovation Solution
The electrical connection device incorporates a high-rigidity portion in the probe that spans from the bottom portion to the guide portion, allowing the probe to slide parallel to the guide hole, preventing point contact and subsequent damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the probe is made flexible to allow buckling contact with the inspection object, then the probe can conform to the measurement surface, but the probe slides through the guide holes causing side surface abrasion and damage
Solution Approach 1:
The probe is segmented into distinct functional regions: a high-rigidity portion (including insertion portion and guide hole passage portion) and a low-rigidity buckling portion. This segmentation allows different parts of the probe to have different mechanical properties optimized for their specific functions, resolving the contradiction between flexibility for contact and rigidity for abrasion resistance.
Solution Approach 2:
The probe exhibits local quality variation along its length, with the insertion portion and guide hole passage portion having higher rigidity than the buckling portion. This local differentiation in mechanical properties enables the probe to maintain structural integrity in critical areas while allowing controlled deformation in the buckling region for surface conformance.
2Reliability
If the probe maintains high rigidity throughout to prevent abrasion, then the probe resists damage from sliding, but the probe cannot buckle to conform to the inspection object surface
Solution Approach 1:
The probe is divided into functional segments with different rigidity characteristics. The high-rigidity insertion portion and guide hole passage portion resist abrasion during insertion and guidance, while the separate low-rigidity buckling portion enables surface conformance, resolving the contradiction between overall rigidity and localized flexibility.
Solution Approach 2:
Different regions of the probe have locally optimized mechanical properties: the insertion portion and guide hole passage portion have high rigidity for abrasion resistance, while the buckling portion has low rigidity for adaptability. This local quality differentiation resolves the contradiction between durability and surface conformance.
3Ease of operation
If the probe passes through offset guide holes to prevent adjacent probe contact, then probe-to-probe interference is reduced, but the probe slides diagonally causing side surface rubbing and damage
Solution Approach 1:
The probe structure is segmented to separate the guidance function (handled by the high-rigidity insertion and guide hole passage portions) from the contact function (handled by the buckling portion). This segmentation allows the probe to follow the offset guide hole path for proper positioning while the rigid portions resist abrasion during the sliding motion.
Solution Approach 2:
The rigidity parameter is changed along the probe length, with higher rigidity in the insertion and guide hole passage portions. This parameter variation enables the probe to withstand the abrasive sliding motion through guide holes while maintaining the offset positioning function, resolving the contradiction between ease of operation and durability.
Data Source
AI summary
An electrical connection device includes: a probe (10); and a probe head (20) including a top portion (21) allowing penetration of the probe (10), a bottom portion (23) disposed closer to a distal end portion than the top portion (21) and allowing penetration of the probe (10), and an upper guide portion (24) and a lower guide portion (25), which are disposed between the top portion (21) and the bottom portion (23) and allow penetration of the probe (10), wherein the probe (10) is held in a curved state between the top portion (21) and the bottom portion (23), the probe (10) buckles by contact of the distal end portion with an inspection object (2), and at least a continuous portion of the probe (10), which ranges from a portion where the probe (10) in a buckling state penetrates the bottom portion (23) to a portion where the probe (10) penetrates the lower guide portion (25), is a high-rigidity portion (101) made to have higher rigidity than a buckling portion of the probe (10).