Probe Assembly Spacer Segmentation for Insertion Throughput
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Solution Overview
Problem
The throughput of automated probe insertion processes in probe card assembly is limited by the thickness of the dielectric spacer plate, which affects the time required for inserting probes through the assembly, and existing solutions do not efficiently balance structural stability with reduced insertion time.
Innovation Solution
A plurality of dielectric spacer plates are used, with a thinner unitary spacer plate for initial insertion and a sliding spacer plate inserted laterally to achieve the final vertical spacing, reducing the initial insertion time without compromising structural stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If a thick dielectric spacer plate is used to maintain structural stability, then the probe insertion time increases, but if a thin dielectric spacer plate is used to reduce insertion time, then structural stability is compromised
Solution Approach 1:
The dielectric spacer function is divided into two separate components: a thin unitary dielectric spacer plate that provides initial spacing during automated probe insertion, and a thicker sliding dielectric spacer plate that is inserted later to achieve final spacing and enhanced structural stability. This segmentation allows the insertion process to benefit from the thin plate while the final assembly benefits from the thick plate's stability.
Solution Approach 2:
The thin unitary dielectric spacer plate is placed in position before automated probe insertion to enable rapid initial positioning. After insertion is complete, the additional thick sliding dielectric spacer plate is then inserted to provide the final structural stability. This preliminary action with the thin plate allows the time-sensitive insertion to proceed quickly.
2Productivity
If a thick dielectric spacer plate is used, then structural stability is maintained, but the throughput of probe insertion operations decreases
Solution Approach 1:
The dielectric spacer function is divided into two separate components: a thin unitary dielectric spacer plate that provides initial spacing during automated probe insertion, and a thicker sliding dielectric spacer plate that is inserted later to achieve final spacing and enhanced structural stability. This segmentation allows the insertion process to benefit from the thin plate while the final assembly benefits from the thick plate's stability.
Solution Approach 2:
The thin unitary dielectric spacer plate is placed in position before automated probe insertion to enable rapid initial positioning. After insertion is complete, the additional thick sliding dielectric spacer plate is then inserted to provide the final structural stability. This preliminary action with the thin plate allows the time-sensitive insertion to proceed quickly.
3Loss of time
If a thin dielectric spacer plate is used for initial insertion, then insertion time is reduced, but additional steps are required to achieve final spacing
Solution Approach 1:
The dielectric spacer function is divided into two separate components: a thin unitary dielectric spacer plate that provides initial spacing during automated probe insertion, and a thicker sliding dielectric spacer plate that is inserted later to achieve final spacing and enhanced structural stability. This segmentation allows the insertion process to benefit from the thin plate while the final assembly benefits from the thick plate's stability.
Solution Approach 2:
The sliding dielectric spacer plate is designed to be inserted laterally after the initial probe insertion is complete, allowing the assembly process to adapt dynamically to the needs of each stage. The sliding mechanism enables the thick plate to be added without requiring repositioning of already-inserted probes, minimizing additional complexity.
Data Source
AI summary
A probe assembly includes a multilayer structure including probe contact pads, an upper guide plate including an array of upper holes therethrough, a lower guide plate including an array of lower holes therethrough, a vertical stack of a plurality of dielectric spacer plates located between the upper guide plate and the lower guide plate and including a respective opening therethrough, and an array of probes attached to the probe contact pads, vertically extending through the array of upper holes and the array of lower holes, and vertically extending through the openings through the vertical stack of the plurality of dielectric spacer plates.


