Testing Probe Sphere Contact and Adhesive Release Mechanism

The patent introduces a sphere as an intermediary contact element between the testing probe and the array substrate. The sphere rolls on the substrate surface during testing, distributing contact pressure and preventing direct scratching by the probe body. This mediator approach maintains testing contact quality while eliminating the harmful scratching effect on the substrate surface.

The patent employs a spherical contact tip instead of a conventional pointed or flat probe end. The spherical shape allows for rolling contact rather than sliding friction, significantly reducing abrasive wear on the substrate surface. The curved surface distributes contact forces more evenly, preventing concentration of stress that causes scratching while maintaining reliable electrical contact for testing.

The spherical contact tip enables rolling motion during probe movement across the substrate. Rolling contact generates significantly lower friction coefficients compared to sliding contact, minimizing wear on both the probe and substrate. The spherical geometry maintains continuous surface contact through its curvature, ensuring stable electrical connection while reducing frictional forces that cause wear.

The patent transforms the static sliding contact into a dynamic rolling contact system. The sphere can rotate and roll as the probe moves, adapting to surface variations while maintaining contact. This dynamic rolling mechanism reduces friction and wear compared to static sliding, while the continuous rolling contact preserves contact stability for reliable testing.