Probe Station Controller Subset Testing Automation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional probe stations lack flexibility in testing operations, limiting the ability to efficiently control and configure test routines for devices under test.

Innovation Solution

The implementation of a probe station system that includes a controller and user interface for generating and executing test routines, which involves constructing a substrate map, receiving user inputs for selecting test and pre-test subsets, and autonomously executing electrical tests with optional pre-test routines, allowing for flexible and automated testing configurations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If conventional probe stations are used with basic testing capability, then the device can perform simple electrical tests, but the testing flexibility and operational control are insufficient

Engineering Contradiction:
Improvetesting flexibilityVSAvoidsystem complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The testing process is segmented into distinct phases: pre-test subset execution and main test subset execution. The controller divides the test routine into separate executable segments that can be independently configured and performed, allowing flexible combination of testing operations without requiring complete system redesign.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system employs dynamic configuration capabilities where the test routine can be modified and reconfigured during operation. The controller accepts user inputs to dynamically adjust test parameters, subset selections, and testing sequences, enabling the system to adapt to different testing scenarios without physical hardware changes.

Inventive Principle:
Principle #15Dynamics

2Ease of operation

If automated test routines are implemented with user inputs, then operational control is improved, but the system requires more complex configuration and execution control

Engineering Contradiction:
Improveoperational controlVSAvoidcontroller complexity
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The controller is designed to autonomously execute test routines based on user-provided inputs without requiring continuous human supervision. Once configured, the system self-manages the execution flow, automatically transitioning between pre-test and main test subsets, and handling test data collection and processing independently.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system performs preliminary testing on a pre-test subset before executing the main test routine. This preliminary action allows the system to prepare and validate test conditions in advance, ensuring proper configuration before full-scale testing begins, thereby simplifying overall operational control.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11016121B2Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-test
Publication Date: 2021.05.25 FORMFACTOR INC
  • US11016121B2 patent drawing
  • US11016121B2 patent drawing
  • US11016121B2 patent drawing

AI summary

Methods of controlling the operation of probe stations and probe stations that perform the methods. The methods including generating a test routine by constructing a substrate map, receiving a test subset input from a user, and updating the substrate map to incorporate information regarding which devices under test (DUTS) of a plurality of DUTs are in a test subset of a plurality of DUTs. The methods also include receiving a pre-test subset input from the user, wherein the pre-test subset is a subset of the test subset, and updating the substrate map to incorporate information which DUTs of the test subset are in the pre-test subset. The methods further include executing the test routine by moving a probe assembly to each DUT in the test subset, selectively performing a pre-test routine on each DUT that is in the pre-test subset, and electrically testing each DUT in the test subset.