Probe Station Fixture with Moveable Carriage Assembly
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Solution Overview
Problem
Conventional test equipment for printed circuit boards faces issues with the probe holder and microscope being at unrelated positions, leading to inconvenient movement, instability due to weight block tilting, clearance issues requiring additional components, and limited versatility for multi-point testing.
Innovation Solution
A support fixture with two pedestals and a moveable carriage assembly, including an adjustable magnetic base, allows simultaneous movement of the probe holder and microscope, enhances stability, and eliminates the need for additional extensions, while an auxiliary fixture and adjustable magnetic base provide increased measurement capacity and range.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the probe holder and microscope are disposed at two different and unrelated positions, then each component can be independently positioned, but they cannot be moved simultaneously causing inconvenient operation
Solution Approach 1:
The probe holder and microscope are integrated onto a single moveable carriage assembly that moves simultaneously along the X-axis. This merging of functions into one moving unit allows both components to be repositioned together, eliminating the coordination complexity of moving them independently while maintaining operational convenience.
Solution Approach 2:
The moveable carriage assembly serves as a universal mounting platform that accommodates both the probe holder and microscope. This multi-functional carriage system provides a single mechanism for repositioning multiple testing components, thereby improving ease of operation without increasing coordination complexity.
2Reliability
If the vertical support panel is held only by stacked weight blocks, then the structure is simple, but it becomes tilted when the probe holder is disposed on a higher position causing collapse
Solution Approach 1:
The support fixture incorporates a base plate with a large surface area that provides a stable foundation, effectively counterbalancing the weight of the probe holder when positioned at higher locations. This anti-weight design prevents tilting and collapse without requiring complex additional support structures.
Solution Approach 2:
The support structure transitions from a simple vertical stacking arrangement to a three-dimensional configuration with a wide base plate. This dimensional expansion provides rotational stability and prevents tilting, enhancing reliability without significantly increasing structural complexity.
3Manufacturing precision
If the fixing block assembly is arranged to abut against the vertical fixture, then positioning is improved, but a clearance remains equal to the width of the weight block requiring additional extension components
Solution Approach 1:
The design extracts and eliminates the clearance problem by making the moveable carriage assembly adjustable in the X-axis. This adjustability allows the carriage to be positioned precisely at any desired location, eliminating the need for additional extension components to compensate for fixed clearances.
Solution Approach 2:
The moveable carriage assembly incorporates dynamic adjustability in the X-direction, allowing real-time positioning compensation. This dynamic capability eliminates the need for static extension components, improving positioning precision while reducing device complexity.
4Reliability
If the supporting plate unit is made bulky to provide stability, then stability is improved, but it lacks versatility for multi-point test and expansion of inspection capacity
Solution Approach 1:
The support fixture is segmented into modular components: a stable base plate, a moveable carriage assembly, and detachable probe holder/microscope units. This segmentation maintains stability through the solid base while enabling versatility through the modular, reconfigurable carriage and probe components.
Solution Approach 2:
The moveable carriage assembly provides dynamic repositioning capability that maintains stability during operation while enabling versatile multi-point testing. The system can be reconfigured for different testing scenarios without compromising the stable base structure.
Data Source
AI summary
A support fixture is adapted for utilization of a test probe, and includes two pedestals and at least one moveable carriage assembly. Each pedestal includes a spacing block and at least one side plate connected to the spacing block extending in a longitudinal direction. The at least one moveable carriage includes a vertical panel and an adjustable holding device. The vertical panel is engaged with the at least one side plate of one of the two pedestals, and is slidable parallel to the longitudinal direction relative to the at least one side plate of each of the two pedestals. The adjustable holding device is operable for fixing the vertical panel to the at least one side plate of the one of the two pedestals and is adapted to hold the test probe.