Probe Support Apparatus for Stable PCB Electrical Testing
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Solution Overview
Problem
Technicians face challenges in accurately measuring electrical signals on printed circuit boards due to the need to manually stabilize probes and operate measuring devices, which can lead to instability and interference during testing.
Innovation Solution
A nonconductive probe supporting apparatus with through-holes and positioning bodies that align probes with testing sites on electronic devices, reducing the need for manual stabilization and minimizing Radio Frequency Interference (RFI).
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a technician manually holds and stabilizes a probe during testing, then the probe can be positioned at the testing site, but the measurement stability and accuracy deteriorate due to hand movement and lack of consistent positioning
Solution Approach 1:
The probe support apparatus acts as an intermediary device between the technician and the probe. It provides a stable mounting structure with positioning features that hold the probe firmly at the correct location, eliminating the need for manual stabilization while maintaining measurement stability and accuracy.
Solution Approach 2:
The apparatus enables the probe to self-position and self-stabilize through its built-in positioning features and support structure. The probe is secured in a fixed position relative to the testing site, allowing the system to maintain measurement stability without requiring continuous manual adjustment or stabilization by the technician.
2Ease of operation
If a technician uses one hand to hold the probe steady, then the probe remains positioned, but the technician cannot simultaneously operate the measuring device controls
Solution Approach 1:
The probe support apparatus serves as a mediator that takes over the probe positioning and stabilization function from the technician's hand. This frees the technician's hands to operate the measuring device controls simultaneously, improving testing efficiency without compromising probe positioning accuracy.
Solution Approach 2:
The testing system is segmented into separate functional components: the probe support apparatus handles positioning and stabilization, while the technician handles device operation and measurement analysis. This division of functions allows both tasks to be performed simultaneously without interference.
3Productivity
If manual probing is used to test electrical characteristics, then the testing can be performed, but RFI and interference increase due to manual handling and movement
Solution Approach 1:
The probe support apparatus acts as a stable intermediary platform that minimizes probe movement and handling. By providing a fixed, controlled position for the probe, it reduces the generation of radio frequency interference and electrical noise that occurs during manual manipulation, thereby improving signal quality during electrical characteristic testing.
4Manufacturing precision
If the probe is held by hand during testing, then the probe can be positioned at the testing site, but the consistency and repeatability of probe positioning deteriorate
Solution Approach 1:
The probe support apparatus provides a precisely engineered intermediary structure with positioning features that ensure consistent and repeatable probe placement. The mechanical design maintains fixed geometric relationships between the probe and testing site, eliminating variations introduced by manual handling while preserving ease of probe installation and removal.
Data Source
AI summary
An apparatus for testing electrical characteristics of a device, having one or more testing sites. The apparatus comprises a nonconductive plate having a through-hole. The through-hole is positioned such that it at least partially overlays one of the one or more testing sites when at least a portion of the bottom surface of the nonconductive plate is adjacent to the device to be tested. The apparatus also comprises a probe positioning body protruding from the top surface of the nonconductive plate and having a through-hole. The probe positioning body is positioned such that the through-hole of the probe positioning body at least partially aligns with the through-hole of the nonconductive plate.