Probe Tip Position Detection Using Oblique Optical Reflection

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Solution Overview

Problem

Existing probe position detection systems in automatic analyzers cannot accurately detect deviations in the depth direction of the probe tip from the target stop position, leading to potential misalignment during sample or reagent dispensing.

Innovation Solution

A probe position detection device that uses a light source to emit illumination light from an oblique direction and an imaging unit to capture the reflected light, allowing for the calculation of the probe's position based on optical images formed on a plane near the target stop position, thereby detecting deviations in both the depth and horizontal directions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a camera is used to image the probe tip at the target stop position to detect horizontal deviation, then the horizontal position adjustment is improved, but the depth direction deviation cannot be detected

Engineering Contradiction:
Improvehorizontal position detection accuracyVSAvoiddepth direction position information
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent transitions from 2D image capture to 3D position detection by introducing a light source that creates optical images on a plane near the target stop position. The reflected light patterns encode depth information, allowing the calculation unit to determine both horizontal and depth deviations of the probe tip from the target position.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent introduces light as an intermediary medium between the probe tip and the camera. The illumination light reflects off the probe tip surface and forms optical images on a plane near the target stop position, enabling indirect depth measurement through the reflected light patterns captured by the imaging unit.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If the probe tip is imaged directly at the target stop position, then the imaging is simplified, but the depth direction deviation from the target stop position cannot be detected

Engineering Contradiction:
Improveimaging system complexityVSAvoiddepth position detection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

Instead of directly imaging the probe tip at the target stop position, the system projects optical images onto a plane near the target stop position using reflected light. This dimensional change allows depth information to be encoded in the reflected light patterns while maintaining relatively simple imaging hardware.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the imaging parameters by illuminating the probe tip from an oblique direction and capturing reflected light patterns on a plane near the target stop position. This parameter change enables depth deviation detection through the geometric relationship between the illumination angle, reflection angle, and image position.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Accurately detects the probe's position, including depth direction deviations, ensuring precise alignment with the target stop position for improved dispensing accuracy in automatic analyzers.

Implementation Method 1

an imaging unit configured to capture an image of periphery of the probe... The imaging unit captures the optical image formed on a plane near the target stop position by the illumination light being reflected on a surface of a tip portion of the probe

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentEP4692809A1Probe position detection device and automatic analysis device
Publication Date: 2026.02.11 HITACHI HIGH TECH CORP
  • EP4692809A1 patent drawingFigure 1
  • EP4692809A1 patent drawingFigure 2~3
  • EP4692809A1 patent drawingFigure 4~5

AI summary

To accurately detect a position of a probe including a deviation in a depth direction from a target stop position. A light source emits illumination light toward a probe, and an imaging unit captures an image of periphery of the probe. A calculation unit calculates a position of the probe according to an optical image which is formed due to reflected light of the illumination light by the probe and captured by the imaging unit. The light source irradiates a tip of the probe with the illumination light from an oblique direction in a state where the tip of the probe is above a target stop position of the probe. The imaging unit captures the optical image formed on a plane near the target stop position by the illumination light being reflected by a surface of a tip portion of the probe. The calculation unit acquires the optical image from the imaging unit and calculates a position of the tip of the probe when the tip of the probe is lowered to the same height as the target stop position.