Field-Replaceable Probe Tip With Retractable Shroud
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Solution Overview
Problem
Existing probes for testing electrical properties of devices face issues such as long effective electrical stub length, non-field-replaceable tips, alignment difficulties, insufficient protection for probe tips, and high manufacturing costs due to complex connector designs, particularly with spring pins.
Innovation Solution
A probe design featuring a field-replaceable tip with a retractable shroud, bifurcated contacts, and an alignment assembly to ensure proper orientation, which includes a housing with a short effective electrical stub length, and a compression connector for engaging devices, allowing for easy tip replacement and reduced manufacturing complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of moving object
If the physical size of contacts is shrunk to reduce electrical stub length, then the conductor length decreases, but the effective electrical stub length increases due to physical arrangement of contacts
Solution Approach 1:
The probe is divided into modular components including a replaceable tip assembly, housing, and cable assembly. The tip contains segmented contacts arranged in a compact configuration that minimizes electrical stub length while maintaining signal integrity through optimized contact geometry and positioning.
Solution Approach 2:
The contacts are arranged in a three-dimensional compact configuration within the tip assembly rather than a linear arrangement. This dimensional optimization allows short conductor paths while maintaining proper contact spacing and alignment, reducing electrical stub length without compromising signal transmission.
2Loss of energy
If passive components are added to decrease electrical stub length, then leakage current is reduced, but the physical arrangement of contacts still limits stub length reduction
Solution Approach 1:
Passive components such as resistors and capacitors are strategically placed at specific locations within the tip assembly where they provide maximum benefit for reducing leakage current and optimizing signal characteristics. The local placement of these components addresses signal integrity issues without adding overall length to the electrical stub.
Solution Approach 2:
The electrical characteristics of the probe are optimized by adjusting parameters such as contact geometry, spacing, and material properties. Passive components are selected with specific values to transform the electrical parameters of the stub, reducing its effective length and minimizing signal distortion while controlling leakage current.
3Reliability
If the entire probe is sent back to manufacturer for tip replacement, then proper calibration is maintained, but time and cost increase significantly
Solution Approach 1:
The probe is segmented into a permanent housing and a replaceable tip assembly. The tip can be independently replaced by the user without sending the entire probe to the manufacturer. The housing contains calibration circuitry that automatically recalibrates the probe when a new tip is installed, maintaining reliability while reducing maintenance time and cost.
Solution Approach 2:
The probe incorporates self-calibration capability that automatically adjusts calibration parameters when a tip is replaced. The housing contains electronic circuitry that detects tip installation and performs calibration routines without requiring manufacturer intervention, enabling users to maintain probe accuracy themselves.
4Reliability
If connector designs use spring pins for reliability, then contact reliability improves, but manufacturing complexity and cost increase
Solution Approach 1:
The tip assembly is designed as a disposable or easily replaceable component with simplified spring pin connectors. Rather than making the entire probe complex and expensive, only the low-cost tip contains the spring pins. When the tip wears or fails, it is replaced rather than repaired, reducing overall system complexity and manufacturing cost while maintaining contact reliability during the tip's service life.
Data Source
AI summary
A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips. An alignment assembly for aligning a probe with respect to a device to be tested includes a first alignment block, a second alignment block, and an alignment piece connecting the first alignment block and the second alignment block. The first alignment block and the second alignment block are arranged to be attached to the device to be tested to align the probe with respect to the device to be tested.