Process Chamber Segmentation for Continuous Deposition and Cleaning

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Solution Overview

Problem

Existing semiconductor process chambers face inefficiencies in throughput due to the need for frequent cleaning, which increases downtime and production costs.

Innovation Solution

The process chamber design includes a substrate support assembly that can move to different positions, sealing off regions for separate operations, allowing simultaneous cooling of substrates and high-temperature cleaning, enabling substrate exchange during cleaning, and using materials with varying thermal conductivities to optimize temperature and gas flow control.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the process chamber is cleaned frequently to improve deposition results, then the quality of deposition process is improved, but the throughput and productivity of the process chamber decreases

Engineering Contradiction:
Improvedeposition process qualityVSAvoidprocess chamber throughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The process chamber is divided into two separate chambers: a first process chamber for performing depositions and a second process chamber for cleaning operations. This segmentation allows both deposition and cleaning to occur simultaneously in different chambers, eliminating the trade-off between deposition quality and throughput by enabling continuous operation without requiring substrate removal for cleaning.

Inventive Principle:
Principle #1Segmentation

2Stability of the object's composition

If the substrate support assembly is positioned close to the chamber wall to seal the volume, then the sealing effectiveness is improved, but the substrate cannot be cooled efficiently

Engineering Contradiction:
Improvesealing effectivenessVSAvoidsubstrate cooling efficiency
Core Design Contradiction:
Stability of the object's compositionVSTemperature

Solution Approach 1:

The substrate support assembly is positioned away from the chamber wall in the horizontal dimension, creating a substrate support assembly cool zone between the substrate support assembly and the chamber wall. Cooling gases are directed into this zone to cool the substrate support assembly and substrate, while the chamber wall itself is cooled through its thickness from the exterior, providing dual-path cooling that maintains both sealing and thermal management.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If cleaning gases are introduced at high temperature to improve cleaning effectiveness, then the cleaning capability is improved, but the substrate may be damaged or require additional cooling time

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidsubstrate cooling time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The cleaning process is segmented into two temperature zones: a cleaning zone where high-temperature cleaning gases are introduced for effective cleaning, and a substrate support assembly cool zone where cooling gases are directed to cool the substrate support assembly and substrate. This spatial segmentation allows simultaneous high-temperature cleaning and cooling operations without compromising substrate integrity or requiring sequential processing.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances throughput by allowing continuous processing while cleaning, reduces downtime, and optimizes energy usage by maintaining target process temperatures quickly and efficiently.

Implementation Method 1

The substrate support assembly can be positioned against the chamber wall to seal the processing volume from the cleaning volume

Methodology Applied
Scientific EffectSealing: Physical Containment

Implementation Method 2

Cooling gases can be directed onto the substrate support assembly to cool the substrate support assembly and the substrate

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 3

cleaning gases can be provided to the cleaning volume when the substrate support assembly is positioned in the cleaning position

Methodology Applied
Scientific EffectChemical cleaning: Oxidation

Data Source

PatentUS12398462B2Process chamber
Publication Date: 2025.08.26 APPLIED MATERIALS INC
  • US12398462B2 patent drawing
  • US12398462B2 patent drawing
  • US12398462B2 patent drawing

AI summary

A process chamber is provided including a chamber body enclosing an interior volume and a substrate support assembly in the interior volume. The substrate support assembly includes a substrate support having a substrate receiving surface, an upper plate, and a lower plate, the upper plate positioned over the substrate support. The substrate support is positioned over and spaced apart from the lower plate.