Process Corner Detection Circuit With Extreme Temperature Indication
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Solution Overview
Problem
Existing integrated circuit designs face challenges in accurately determining process-dependent circuit parameters and temperature, leading to unpredictable variations that affect circuit performance, with existing solutions being complex, power-intensive, and requiring external components.
Innovation Solution
A circuit comprising a PTAT current source, NTAT current source, CTAT current source, corner detector, poly detector, and extreme temperature detector, which uses a combination of MOS transistors and comparators to identify process corners and temperatures without increasing power consumption, utilizing current sources with specific temperature coefficients to distinguish between process variations and temperature effects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional methods (ring oscillator, ADC) are used to detect process variations, then measurement capability is provided, but temperature dependence confuses the detection results
Solution Approach 1:
The detection function is segmented into three independent detectors: corner detector for process corner identification, poly detector for poly layer thickness detection, and extreme temperature detector for temperature monitoring. Each detector uses dedicated circuitry that is insensitive to other parameters, allowing independent measurement of process variations without temperature confusion.
Solution Approach 2:
The patent introduces intermediary detection circuits that act as mediators between the physical parameters and the measurement system. The corner detector uses intermediary current paths that are temperature-compensated, the poly detector uses intermediary voltage comparisons that isolate thickness effects, and the extreme temperature detector uses intermediary thermal response circuits.
2Measurement precision
If complex detection structures with ADC and external resistors are used, then measurement capability is improved, but layout area and calibration time increase
Solution Approach 1:
The patent extracts the detection function from complex external systems and implements it using minimal on-chip resources. Each detector uses only essential transistors and resistors needed for the specific measurement function, removing unnecessary ADC converters, external accurate resistors, and complex calibration circuits while maintaining measurement capability.
Solution Approach 2:
The detection circuits are designed to be self-calibrating by using inherent device characteristics and self-referencing measurement techniques. The corner detector automatically identifies process corners using self-generated current comparisons, the poly detector self-measures thickness through voltage drops, and the extreme temperature detector self-monitors thermal effects without external calibration equipment.
3Measurement precision
If external accurate resistors are used to generate constant current sources, then measurement accuracy is improved, but bill-of-material cost increases
Solution Approach 1:
The patent replaces expensive external accurate resistors with inexpensive on-chip resistor implementations. The corner detector uses simple resistor ratios that can be fabricated directly in the standard process, the poly detector uses minimal resistor structures, and the extreme temperature detector uses resistor networks that are cheap to manufacture while providing sufficient accuracy without requiring external calibration components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for precise identification of process corners and extreme temperatures, reducing power consumption and layout area, while avoiding the complexity and external component requirements of previous methods, thereby enhancing circuit performance and reliability.
Implementation Method 1
a proportional to absolute temperature (PTAT) current source (410), a negative to absolute temperature (NTAT) current source (420), and a constant to absolute temperature (CTAT) current source (430)
Implementation Method 2
a proportional to absolute temperature (PTAT) current source (410), a negative to absolute temperature (NTAT) current source (420), and a constant to absolute temperature (CTAT) current source (430)
Implementation Method 3
a proportional to absolute temperature (PTAT) current source (410), a negative to absolute temperature (NTAT) current source (420), and a constant to absolute temperature (CTAT) current source (430)
Data Source
AI summary
The present invention discloses a circuit used for indicating process corner and extreme temperature. It mainly comprises a proportional to absolute temperature (PTAT) current source, a negative to absolute temperature (NTAT) current source, a constant to absolute temperature (CTAT) current source, a corner detector, a poly detector, an extreme temperature detector. The circuit can save more power consumption without trade-off. In debug phase, the suspect sample can read out which state is and can run simulation check quickly to identify the real problem. In production phase, process indicator can easy read out at CP station. In the mean time, the large quantity of data can be easy collected and analyzed.