Process-Node Visual Inspection for Accurate Defect Removal

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Solution Overview

Problem

Existing production quality inspection devices suffer from misjudgment due to varying process levels and product specifications, leading to insufficient accuracy and the outflow of defective products from factories.

Innovation Solution

A product quality inspection method and apparatus that utilizes imaging units to acquire image data, generate inspection results based on preset parameters, and transmit defective products from the production line, incorporating parameter configuration and verification processes to enhance accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Extent of automation

If visual inspection is performed by a production quality inspection device, then inspection automation is improved, but misjudgment occurs due to different process levels and product specifications

Engineering Contradiction:
Improveinspection automationVSAvoidinspection accuracy
Core Design Contradiction:
Extent of automationVSMeasurement precision

Solution Approach 1:

The system dynamically adjusts imaging parameters (resolution, exposure time, gain) and inspection parameters (thresholds, tolerance ranges) based on the specific process node and product specifications. This allows the automated inspection device to adapt to different process levels and product types, maintaining high accuracy across varying conditions without requiring manual reconfiguration

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system performs preliminary configuration of inspection parameters and imaging settings based on pre-stored process node information and product specification databases. By preparing the appropriate inspection criteria in advance for each process node, the system eliminates the need for manual setup and ensures accurate inspection from the start, preventing misjudgment before it occurs

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If inspection is performed at each process node, then inspection accuracy is improved, but device complexity increases

Engineering Contradiction:
Improveinspection accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system employs a universal inspection platform that can be deployed across multiple process nodes with different imaging units (cameras, microscopes, sensors) that share common processing and control architecture. This multi-functional approach allows the same core system to handle various inspection tasks at different nodes, improving accuracy through comprehensive coverage while avoiding the complexity of completely separate inspection systems for each node

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The inspection system is segmented into modular components: imaging units, processing units, and control units that can be independently configured and deployed at specific process nodes. Each node receives only the inspection capabilities it needs, and results are aggregated centrally. This segmentation allows high inspection accuracy at each node while managing overall system complexity through modular, scalable architecture

Inventive Principle:
Principle #1Segmentation

3Reliability

If defective products are removed promptly, then reliability is improved, but productivity decreases due to product removal from production line

Engineering Contradiction:
Improveproduct quality reliabilityVSAvoidproduction throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system implements rapid inspection and decision-making at each process node, quickly identifying and flagging defective products for removal. By minimizing the time products spend in the inspection and decision process, the system maintains high production throughput while ensuring defective items are promptly removed. The fast processing allows the production line to continue flowing without significant interruptions

Inventive Principle:
Principle #21Skipping (Rushing through)

Data Source

PatentUS20250363614A1Inspection method and apparatus of product quality inspection device, and electronic device thereof
Publication Date: 2025.11.27 CONTEMPORARY AMPEREX TECHNOLOGY CO LTD
  • US20250363614A1 patent drawing
  • US20250363614A1 patent drawing
  • US20250363614A1 patent drawing

AI summary

An inspection method and apparatus for a product quality inspection device are disclosed. The method includes acquiring image data of a first product by a first imaging unit, where the product has been processed at a first process node of a production device, and the imaging unit corresponds to that process node. A first inspection result is generated based on the image data and inspection information associated with the process node, the inspection information including at least one inspection item and a preset parameter range for each item. The inspection result is transmitted to the production device, which removes the product from the production line if the result indicates a defect. The apparatus and method enable real-time defect detection and removal, improving inspection accuracy and production efficiency.