Process-Node Image Inspection for Defect Removal Accuracy
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Solution Overview
Problem
Existing production quality inspection devices suffer from misjudgment due to varying process levels and product specifications, leading to insufficient accuracy and the outflow of defective products from factories.
Innovation Solution
A product quality inspection method and apparatus that utilizes imaging units to acquire image data, generate inspection results based on preset parameters, and transmit defective products out of the production line, incorporating parameter configuration and verification processes to enhance accuracy and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a production quality inspection device is provided to perform visual inspection of products, then quality inspection is achieved, but misjudgment occurs due to different process levels and product specifications, resulting in insufficient inspection accuracy
Solution Approach 1:
The patent applies parameter changes by dynamically adjusting imaging parameters (such as exposure time, gain, resolution) and inspection parameters (such as threshold values, detection sensitivity) based on different process levels and product specifications. This allows the inspection device to adapt to varying production conditions and maintain high inspection accuracy across different scenarios.
Solution Approach 2:
The patent implements dynamics by making the inspection system adaptable and configurable rather than static. The device can dynamically adjust its inspection criteria, imaging settings, and detection algorithms based on the specific product being inspected and the process level, thereby improving measurement precision while maintaining reliable quality inspection.
2Measurement precision
If inspection is performed at each process node, then inspection accuracy is improved, but device complexity increases due to multiple imaging units and inspection configurations
Solution Approach 1:
The patent applies universality by designing a multi-functional inspection system where a single inspection device can handle multiple process nodes and different product types. The device incorporates configurable inspection parameters and adaptable imaging capabilities that allow it to perform various inspection tasks across different stages of production, thereby improving inspection accuracy without proportionally increasing device complexity.
Solution Approach 2:
The patent implements segmentation by dividing the production process into distinct process nodes, each with its own optimized inspection configuration. This allows the inspection system to be modular and targeted, focusing resources on specific critical inspection points rather than uniformly inspecting all products at all stages, thus improving accuracy while managing complexity through strategic segmentation.
3Measurement precision
If defective products are identified and removed promptly, then inspection accuracy is improved, but productivity decreases due to removal of products from production line
Solution Approach 1:
The patent applies preliminary action by performing quality inspection at early process nodes rather than only at the final stage. Defective products are identified and removed promptly after the defect is introduced, preventing further processing of defective items. This approach maintains high inspection accuracy while minimizing the impact on overall productivity by stopping defects early in the production flow.
Solution Approach 2:
The patent implements skipping by enabling the production line to bypass or quickly handle defective products through automated removal mechanisms. Once a defect is detected, the system can rapidly remove the defective product and resume normal production flow, minimizing downtime and maintaining productivity while ensuring high inspection accuracy through prompt defect identification and removal.
Data Source
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AI summary
Disclosed in the present application are an inspection method and apparatus of a product quality inspection device, and an electronic device thereof. The method including: acquiring first image data of a first product by a first imaging unit, wherein the first product is obtained through processing at a first process node in a production device, the first imaging unit corresponding to the first process node; generating a first inspection result of the first product according to the first image data and first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item; and transmitting the first inspection result to the production device to cause the production device to remove the first product from a production line if the first inspection result comprises that the first product has a defect.