Processor-Based Measuring Method for Electronic Device Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional measuring tools for testing electronic devices require expensive hardware and struggle with real-time data analysis, making them costly and unsuitable for high-speed testing.
Innovation Solution
A processor-based measuring method that uses a microprocessor to generate test patterns, control switches, and analyze data in real-time, eliminating the need for physical modules like pattern generators and analog signal processing devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional physical measuring devices (pattern generator, leakage current test unit, analog signal processing device) are used, then measurement precision and reliability are improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent replaces physical measuring devices with their functional equivalents implemented as software modules executed by a microprocessor. The pattern generator is copied as a pattern generation software module, the leakage current test unit as a leakage current calculation software module, and the analog signal processing device as an analog signal processing software module. This copying approach maintains measurement precision while eliminating complex hardware components.
Solution Approach 2:
The patent substitutes mechanical and electronic hardware systems with a software-based system. Instead of using physical pattern generators, leakage current test units, and analog signal processing devices, the invention implements all these functions as software modules running on a microprocessor, thereby replacing the mechanical/electronic system with an information-processing system.
2Reliability
If conventional physical measuring devices are used, then measurement reliability is improved, but manufacturing cost increases
Solution Approach 1:
The patent copies the functional capabilities of expensive physical measuring devices into software modules. The pattern generator, leakage current test unit, and analog signal processing device are all replicated as software implementations, which can be distributed and executed without additional hardware manufacturing costs, thereby maintaining reliability while reducing manufacturing expense.
Solution Approach 2:
The patent changes the fundamental parameter of implementation from hardware to software. By transitioning from physical devices with fixed hardware parameters to software modules with flexible code-based parameters, the system achieves the same measurement reliability at a lower manufacturing cost, as software can be updated and modified without hardware re fabrication.
3Speed
If separate physical data comparator device is used for real-time data comparison, then data comparison speed is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent merges the data comparison function with the microprocessor that already executes the test programs. Instead of using a separate physical data comparator device, the invention integrates the comparison functionality into the existing processor architecture through software implementation, thereby achieving real-time data comparison without increasing device complexity.
Solution Approach 2:
The patent makes the microprocessor universal by enabling it to perform multiple functions: executing test programs, generating patterns, calculating leakage currents, processing analog signals, and comparing data. This multi-functional approach eliminates the need for separate dedicated comparator hardware, reducing device complexity while maintaining high-speed operation.
Data Source
AI summary
Provided is a measuring method for testing a device under test (DUT) having a plurality of terminals and, particularly, to a means for measuring the functions and performance of various electronic devices in which an electronic circuit such as that in an electronic device, a semiconductor element, a circuit module, and a circuit board is mounted, and to: a method by which a processor supports measurement with software such that unit costs can be reduced to be lower than those of conventional means operating with various, high-cost hardware; and a device using the same.


