Automated Test Bench Generation for Processor Decoder Verification

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Solution Overview

Problem

The increasing number of processors developed requires a corresponding increase in test benches for verification, which is time-consuming and inefficient.

Innovation Solution

A method and apparatus for generating a test bench to verify a processor decoder by parsing architecture descriptions into operation code, source, and destination information, and comparing results with a reference model and a design under test processor decoder.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the number of processors developed increases, then the processing capability and functionality improve, but the time required for verification increases

Engineering Contradiction:
Improveprocessor varietyVSAvoidverification time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The patent creates a universal test bench generation system that can handle multiple processor architectures (VLIW, CGRA, and other parallel processors) through a single apparatus. The architecture description parser and test bench generator are designed to be architecture-agnostic, accepting standardized architecture descriptions and producing appropriate test benches for different processor types, thereby eliminating the need to create separate verification systems for each processor architecture.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent uses architecture descriptions as abstract templates that can be copied and instantiated for different processor designs. Instead of manually creating test benches for each processor, the system parses the architecture description (a textual representation) and automatically generates the corresponding test bench, effectively copying the verification logic from the architectural specification to the test implementation.

Inventive Principle:
Principle #26Copying

2Reliability

If manual test bench creation is used for each processor, then verification accuracy can be maintained, but the effort and time required increase significantly

Engineering Contradiction:
Improveverification accuracyVSAvoidverification efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The test bench generation system is self-service in that it automatically parses architecture descriptions and generates test benches without requiring manual intervention for each processor design. The apparatus extracts verification requirements directly from the architecture description and produces test benches autonomously, reducing reliance on manual engineering while maintaining verification quality through systematic parsing and generation rules.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent introduces architecture descriptions as an intermediary representation between the processor design and the test bench. Instead of manually translating design requirements into test benches, the architecture description serves as a standardized intermediate format that the parser can systematically interpret and the generator can automatically transform into verification test benches, ensuring consistency and accuracy.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Loss of time

If automated test bench generation is implemented, then verification time is reduced, but the initial system complexity increases

Engineering Contradiction:
Improvetest bench creation timeVSAvoidgeneration system complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The test bench generation system is segmented into distinct functional modules: an architecture description parser that extracts verification requirements, a test bench generator that creates test cases, and a verification environment that executes tests. This modular segmentation reduces overall system complexity by allowing each component to be developed, tested, and maintained independently while working together to achieve automated test bench generation.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS10055318B2Method and apparatus for generating test bench for verification of processor decoder
Publication Date: 2018.08.21 SAMSUNG ELECTRONICS CO LTD
  • US10055318B2 patent drawing
  • US10055318B2 patent drawing
  • US10055318B2 patent drawing

AI summary

A method and apparatus for generating a test bench for verifying a processor decoder are provided. The method including receiving an architecture description comprising processor decoder information, parsing the received architecture description into information for verifying the processor decoder, and generating the test bench to verify the processor decoder based on the parsed information.