Processor Leakage Current Cooling Control
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Solution Overview
Problem
Multiprocessor systems face challenges in managing heat buildup due to varying leakage currents among processors, leading to potential overheating and low yield, especially when manufactured as a single integrated circuit, where a single malfunctioning processor can cause the entire circuit to be discarded.
Innovation Solution
Measuring and storing leakage current levels in a memory associated with each processor, and using a fan with adjustable speed based on the leakage current indicator value to prevent overheating, allowing for precise cooling control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If processors are manufactured separately with quality control, then each processor can be individually tested and discarded if defective, but the manufacturing cost increases due to considerable number of separate manufacturing operations
Solution Approach 1:
The patent divides the multiprocessor system into individually addressable processor segments, each with its own leakage current characteristics. This allows selective cooling of specific processors rather than cooling the entire system uniformly, enabling cost-effective manufacturing by allowing integration while maintaining individual processor quality control through post-fabrication testing and selective cooling.
2Ease of manufacture
If multiprocessor system is manufactured as a single integrated circuit, then manufacturing cost is reduced and uniformity among processors is provided, but a single non-performing processor causes the entire circuit to be discarded, substantially reducing overall yield
Solution Approach 1:
The patent implements dynamic, selective cooling control for individual processors within the integrated multiprocessor system. By measuring leakage current for each processor and providing individually controllable cooling, the system can operate with suboptimal processors that would otherwise be discarded, thereby maintaining high manufacturing yield while preserving system functionality.
Solution Approach 2:
The patent changes the operational parameters of individual processors by adjusting cooling based on measured leakage current characteristics. This allows processors with varying leakage current parameters to operate within acceptable temperature ranges, preventing the need to discard entire integrated circuits due to single processor deficiencies.
3Reliability
If high-leakage-current processors are discarded at fabrication stage, then overheating of multiprocessor system is prevented, but the yield of useable processors becomes very low
Solution Approach 1:
The patent implements a feedback mechanism where leakage current of each processor is measured and this information is used to control cooling applied to that specific processor. This feedback loop allows high-leakage processors to be retained and operated with enhanced cooling, converting what would be discarded processors into usable components and significantly improving yield while preventing overheating.
4Device complexity
If uniform cooling is applied to all processors, then overheating prevention is simplified, but processors with varying leakage currents cannot receive tailored cooling, potentially leading to wasted cooling capacity or insufficient cooling for high-leakage processors
Solution Approach 1:
The patent applies local quality by providing individually controllable cooling for each processor based on its specific leakage current characteristics. Instead of uniform cooling across the entire system, each processor receives customized cooling appropriate to its thermal profile, optimizing cooling effectiveness while allowing the system to accommodate processors with varying leakage currents.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method effectively prevents overheating while minimizing processor wastage by allowing for individual cooling adjustments, thereby increasing the yield of usable multiprocessor systems and ensuring reliable operation.
Implementation Method 1
a fan adapted to direct air flow toward the processor
Data Source
AI summary
A system and method are disclosed which may include measuring a leakage current level of a processor or multiprocessor chip; and storing an indicator value indicative of the leakage current level in a memory associated with the processor or multiprocessor chip.