Processor Memory Stress Testing with Variable Link Stack Depth
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Solution Overview
Problem
Existing processor testing tools face challenges in generating efficient stress test cases that can effectively test various timing scenarios and link stack depth scenarios, which are labor-intensive and resource-intensive, especially in ensuring cache memory coherency and varying link stack depths.
Innovation Solution
A system and method for stress testing processor memory using test code segments placed on non-naturally aligned data boundaries, interspersed with link stack test segments that vary the link stack depth through branch to target, push/pop segments, allowing for independent variation of link stack depth without altering the test code results, utilizing a recursive algorithm to randomly place these segments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional labor-intensive test case generation methods are used to thoroughly test processor memory with various link stack depth scenarios, then test coverage and reliability are improved, but time consumption and resource requirements increase significantly
Solution Approach 1:
The test code is divided into multiple segments that can be independently arranged and executed. Each segment represents a unit of test functionality that can be combined with different link stack depth configurations, enabling systematic coverage of various scenarios without manually creating each complete test case from scratch.
Solution Approach 2:
The test case structure is made dynamic through configurable link stack depth parameters. The same base test code can be executed with varying link stack depths by modifying runtime parameters, allowing the system to adaptively test different scenarios without requiring separate static test cases for each configuration.
2Reliability
If separate test cases are created for each link stack depth scenario to ensure thorough testing, then test completeness is improved, but device complexity and effort required increase
Solution Approach 1:
A universal test code structure is created that can function across multiple link stack depth scenarios. The test code includes configurable elements and parameters that allow it to be adapted to different link stack depths without requiring fundamental changes to the test logic, making a single test suite serve multiple testing purposes.
Solution Approach 2:
Instead of creating structurally different test cases for each link stack depth, the invention uses parameter changes to control the link stack depth during test execution. By modifying runtime parameters such as the number of recursive calls or stack operations, the same test code can evaluate different link stack depth scenarios, simplifying the overall test case structure.
3Productivity
If test code is optimized for specific link stack depths, then execution efficiency is improved, but adaptability to different link stack configurations decreases
Solution Approach 1:
The test code is designed with dynamic characteristics that allow it to efficiently execute across different link stack depths. Configurable parameters and conditional logic enable the same optimized code path to adapt to varying stack configurations, maintaining execution efficiency while preserving versatility.
Solution Approach 2:
Execution efficiency is maintained across different link stack configurations by using parameter changes rather than structural modifications. The test code contains optimized algorithms that work efficiently regardless of the specific link stack depth, with parameters adjusted at runtime to match the target configuration, thus preserving both efficiency and adaptability.
Data Source
AI summary
A processor memory is stress tested with a variable link stack depth using test code segments and link stack test segments on non-naturally aligned data boundaries. Link stack test segments are interspersed into test code segments of a processor memory test to change the link stack depth without changing results of the test code. The link stack test segments include branch to target, push/pop, push and pop segments. The depth of the link stack is varied independent of the memory test code by changing the number to branches in the branch to target segment and varying the number of the push/pop segments. The link stack test segments and test segments may be placed randomly with a recursive algorithm to intersperse the link stack test segments in the test code segments and to reduce the amount of data to be saved and restored for all subroutine calls, push and pop segments.