Processor Soft Error Protection Dynamic Control
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Solution Overview
Problem
As the number of transistors on a chip increases, radiation-induced soft errors become more prevalent, making it challenging to maintain reliability in processors while also facing power consumption limitations that restrict performance due to energy inefficiencies in computing systems.
Innovation Solution
The processor dynamically enables and disables soft error protection features based on operating voltage, reducing power consumption by disabling these features at higher voltages where soft errors are less likely, allowing for increased performance through higher operating voltages and frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If soft error protection features are enabled to maintain reliability, then reliability is improved, but power consumption increases
Solution Approach 1:
The patent implements dynamic control of soft error protection features by enabling them at low operating voltages and disabling them at high operating voltages. This dynamic adjustment allows the system to optimize the balance between reliability and power consumption based on real-time operating conditions, rather than using a static configuration.
Solution Approach 2:
The patent changes the operational parameters of soft error protection features based on operating voltage levels. By monitoring voltage and dynamically adjusting protection feature states, the system adapts reliability mechanisms to match environmental conditions, reducing unnecessary power consumption when protection is less critical at higher voltages.
2Productivity
If operating voltage is increased to improve performance, then productivity is improved, but soft error rate increases
Solution Approach 1:
The system dynamically adjusts soft error protection features based on operating voltage levels. When voltage increases to improve performance, the system disables protection features that are less effective at higher voltages, and enables them when voltage decreases, maintaining an optimal balance between performance and reliability.
Solution Approach 2:
The patent changes the state of soft error protection features in response to voltage parameter changes. By linking protection feature enablement to voltage thresholds, the system optimizes performance at high voltages while maintaining reliability at low voltages where soft errors are more prevalent.
3Use of energy by moving object
If soft error protection features are disabled to reduce power consumption, then power consumption is reduced, but reliability deteriorates
Solution Approach 1:
The patent implements dynamic control of soft error protection features by enabling them at low operating voltages and disabling them at high operating voltages. This dynamic adjustment allows the system to optimize the balance between reliability and power consumption based on real-time operating conditions, rather than using a static configuration.
Solution Approach 2:
The patent changes the operational parameters of soft error protection features based on operating voltage levels. By monitoring voltage and dynamically adjusting protection feature states, the system adapts reliability mechanisms to match environmental conditions, reducing unnecessary power consumption when protection is less critical at higher voltages.
Data Source
AI summary
In one embodiment, a processor core has one or more execution units, a first memory array having a first protection circuit to provide soft error protection to the first memory array, and a control circuit. A power controller coupled to the core may include a protection control circuit, in response to an update to an operating voltage to be provided to the core, to cause the core to disable the first protection circuit. Other embodiments are described and claimed.