Processor Voltage Characterization for Power Reduction
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Solution Overview
Problem
Integrated circuits in computing devices face challenges with high power consumption, leading to increased stresses, reduced reliability, and heat dissipation issues due to manufacturing voltage margins, which are not accurately represented by built-in system test results.
Innovation Solution
A method involving functional tests that exercise processing devices at iteratively adjusted voltages across associated system elements to determine reduced operating voltages, allowing for power savings without performance degradation, and incorporating voltage regulation modules with selectable voltage supply values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manufacturer specified voltage margins are used to ensure reliable operation, then reliability is improved, but power consumption increases and component stresses increase
Solution Approach 1:
The patent applies parameter changes by iteratively adjusting the supply voltage to different processing domains from the manufacturer-specified voltage margins down to lower operating voltages. Functional tests are executed at each voltage level to determine the minimum voltage required for reliable operation, thereby reducing power consumption while maintaining reliability.
Solution Approach 2:
The patent implements local quality by applying different voltage levels to different processing domains (e.g., CPU, GPU, I/O domains) based on their specific requirements. Each domain is independently tested and characterized to determine its optimal operating voltage, allowing some domains to operate at lower voltages while others maintain higher voltages for stability.
2Reliability
If manufacturer specified voltage margins are used to ensure reliable operation, then reliability is improved, but component stresses increase
Solution Approach 1:
The patent reduces component stresses by changing the operating voltage parameter from the conservative manufacturer-specified margins down to the actual minimum required voltage. This is achieved through iterative voltage adjustment and functional testing, allowing components to operate at lower stress levels while maintaining reliability.
3Manufacturing precision
If built-in system test results are used for voltage characterization, then manufacturing precision is improved, but measurement precision deteriorates because built-in tests do not accurately represent actual operating conditions
Solution Approach 1:
The patent employs self-service by using the processing device's own functional capabilities to test and characterize its voltage requirements. The device executes functional tests under actual operating conditions with real workloads, allowing it to self-determine its minimum operating voltage without relying on generic built-in system tests that do not reflect true operational scenarios.
4Use of energy by moving object
If voltage reduction techniques are applied to save power, then power consumption is reduced, but operational failures may occur
Solution Approach 1:
The patent implements feedback by continuously monitoring functional test results during iterative voltage adjustment. When operational failures occur at a given voltage level, the system receives feedback and adjusts the voltage upward or terminates the test, ensuring that the final operating voltage maintains reliability while minimizing power consumption.
Solution Approach 2:
The patent applies dynamics by making the operating voltage adjustable and adaptive rather than fixed. The system dynamically determines the minimum operating voltage through iterative testing and can adjust voltage levels based on actual operational requirements, balancing power savings with operational stability.
Data Source
AI summary
Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes executing a voltage characterization service for a processing device of a computing apparatus to determine at least one supply voltage for the processing device, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, determining at least one resultant supply voltage.