Production Defect Detection Using Multi-Stage Parametric Indicators

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Solution Overview

Problem

Automated production processes face challenges in detecting defects early and efficiently, as defects may go unnoticed until later stages or even after the item is in use, leading to increased correction costs and potential downstream errors.

Innovation Solution

A system comprising a processor and memory that uses a machine learning component to analyze parametric data from multiple stages, identifying common attributes between defective and non-defective items, and generating defect indicators to recognize defects in real-time, even when measurements are within tolerance thresholds.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If traditional defect detection methods are used, then defects may be detected, but detection occurs too late (after items progress through multiple stages), leading to increased correction costs and downstream errors

Engineering Contradiction:
Improvetime to detect defectVSAvoiddefect detection accuracy
Core Design Contradiction:
Loss of timeVSReliability

Solution Approach 1:

The system performs preliminary defect detection by analyzing parametric data from multiple production stages simultaneously, rather than waiting for traditional sequential inspection. The machine learning model proactively identifies defect indicators before items complete all production stages, enabling early intervention and reducing correction costs while maintaining high detection accuracy through multi-stage data correlation.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If machine learning analysis of parametric data is implemented, then early defect detection is enabled, but system complexity increases

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidsystem complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system introduces an intermediary machine learning model that processes complex parametric data from multiple production stages. This intermediary component translates raw parametric data into actionable defect indicators, enabling early and accurate defect detection without requiring direct complex analysis of all underlying production parameters. The intermediary model manages system complexity by abstracting the analytical complexity from the production control system.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If defect indicators are generated based on common attributes, then detection precision improves, but false positives may occur when common attributes are shared with non-defective items

Engineering Contradiction:
Improvedefect indicator precisionVSAvoidfalse positive rate
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The system applies local quality by creating stage-specific defect indicators tailored to each production stage's characteristics. Rather than using generic defect indicators across all stages, the machine learning model generates customized indicators that account for the specific parametric variations and defect patterns of each stage. This localized approach improves precision by reducing false positives that would occur with universal indicators applied to diverse production contexts.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS11982995B2Defect detection during an automated production process
Publication Date: 2024.05.14 ROCKWELL AUTOMATION TECH INC
  • US11982995B2 patent drawing
  • US11982995B2 patent drawing
  • US11982995B2 patent drawing

AI summary

Described herein are systems and methods for improving defect detection in an automated production process. The system comprises a memory that stores executable components and a processor, operatively coupled to the memory, that executes the executable components. The executable components comprise an automation defect component and a machine learning component. The automation defect component retrieves parametric data associated with the production process. The automation defect component provides the parametric data to a machine learning algorithm. The machine learning component generates common attributes between the defective items. The machine learning component identifies a set of common attributes shared between the defective items and a non-defective item. The machine learning component modifies the set of the common attributes shared between the defective items and the non-defective item. The machine learning component generates defect indicators based on the common attributes. The automation defect component monitors subsequent parametric data to recognize the defect indicators.