Production Line KPI Generation from Multi-Sensor Data

The patent implements a universal KPI determination system that can handle multiple sensor types (magnetic relays, temperature sensors, conductive sensors, flow transmitters) and different production line configurations through a single standardized interface. The system uses standardized data collection methods and unified processing logic that work across diverse sensor configurations, allowing one system to serve multiple functions and adapt to various production needs without requiring separate KPI determination setups for each configuration.

The system manages complexity by dynamically adjusting processing parameters based on the specific sensor configuration detected. When different sensor types are identified, the system automatically modifies its data collection frequency, processing algorithms, and aggregation methods accordingly. This allows the system to adapt to various production line setups while maintaining a consistent underlying architecture, resolving the contradiction between handling diverse configurations and maintaining system simplicity.

The patent employs pre-configured templates and standardized data structures for common sensor types and production line configurations. Before deployment, the system comes with built-in knowledge of how to process data from various sensor types (magnetic relays, temperature sensors, etc.) and pre-established KPI calculation methodologies. When a production line is set up, the system automatically matches the detected sensor configuration to appropriate pre-configured templates, eliminating the need to create KPI measurement structures from scratch and dramatically reducing setup time while maintaining adaptability.

The system uses template copying and configuration reuse across different production lines. Once a KPI measurement structure is established for a particular sensor configuration, it can be replicated and adapted for similar production lines. The system stores successful configurations as reusable templates that can be copied and modified for new installations, significantly reducing the time required to set up KPI measurement structures for subsequent production lines while maintaining the ability to handle diverse configurations.

The patent divides the data architecture into distinct segments: standardized variable generation schemes that are shared across production lines for consistency and productivity, and production-line-specific KPI generation schemes that remain localized and confidential. The system separates universal processing logic (which can be standardized) from proprietary business logic (which should remain confidential). This segmentation allows standardized variables to be generated efficiently while keeping sensitive KPI calculations and business rules confined to individual production lines, thus maintaining both productivity and information security.

The system introduces an intermediary layer that acts as a buffer between standardized data collection and proprietary KPI generation. This intermediary layer handles the standardized variable generation and data normalization, then passes processed data to the production-line-specific KPI generation systems. The intermediary ensures that standardized processing benefits are achieved while the actual sensitive KPI calculations and business logic remain isolated and confidential to each production line, preventing unauthorized access while maintaining productivity through standardization.