Production Path Pattern Analysis for Defective Device Sequences
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods cannot identify sequential orders of multiple devices that produce defective products in a production line, especially when negative interactions occur between devices, leading to defective products due to combinations of processes like drilling and screwing.
Innovation Solution
An apparatus and method that analyze production path data to identify sequential orders of devices contributing to defective products by generating and evaluating path patterns, estimating their quality, and identifying patterns with a predetermined threshold of defectiveness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single device is identified as defective using existing methods, then the identification process is simple, but sequential orders of multiple devices producing defective products cannot be identified
Solution Approach 1:
The patent segments the production path into multiple discrete device steps and analyzes each segment's contribution to product quality. By dividing the overall production process into individual device segments and evaluating their sequential interactions, the system can identify specific device combinations and orders that cause defects, rather than treating the production line as a single unit.
Solution Approach 2:
The patent introduces a new dimension of analysis by considering not just individual device performance but also the sequential order and combinations of devices. This transforms the problem from one-dimensional (single device evaluation) to multi-dimensional (device sequences, paths, and interactions), enabling identification of defective device orders that single-device analysis cannot detect.
2Measurement precision
If path patterns of multiple devices are analyzed to identify defective sequences, then sequential orders producing defective products can be identified, but the analysis complexity increases
Solution Approach 1:
The patent performs preliminary actions by pre-defining and storing multiple possible production paths and device sequences in a database before actual defect analysis. This preparation work includes establishing the hierarchical structure of device combinations and sequences, which reduces the computational burden during actual defect identification by avoiding exhaustive real-time analysis of all possible device orderings.
Solution Approach 2:
The patent creates simplified representations (copies) of production paths and device sequences as structured data models. Instead of analyzing the complex physical production system directly, the system works with copied digital representations of production paths, device orders, and quality data, which can be manipulated and analyzed more efficiently while preserving the essential relationships.
Data Source
Figure 1
Figure 2A~2C
Figure 2D
AI summary
An apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of device is provided. The device is configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in a path pattern, based on a production path quality and an association relationship between a path pattern and a production path indicating devices via which the product is produced and an order of passing through the devices; and to identify a path pattern suspected to be defective based on the estimated path pattern quality.