Profile Measuring Apparatus Using Dynamic Pattern Rotation
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Solution Overview
Problem
Conventional profile measuring techniques face challenges in efficiently measuring the surface profiles of objects using contact-type measuring probes, particularly in achieving high precision and adaptability for various object geometries and orientations.
Innovation Solution
A profile measuring apparatus that incorporates a projection unit, a measurement unit, an object-rotation unit, and a pattern-rotation unit, utilizing the light-section method to project a linear pattern and calculate the object's three-dimensional profile by rotating the object and pattern relative to each other, allowing for precise measurement from different angles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a contact-type measuring probe is used to measure surface profiles, then measurement precision can be achieved, but the complexity of the device and difficulty of operation increase
Solution Approach 1:
The patent replaces the contact-type mechanical measuring probe with a non-contact optical measurement system. The projection unit projects patterns onto the object surface, and the measurement unit captures images to calculate three-dimensional profile information through optical methods, eliminating the need for physical contact and complex mechanical probe structures.
Solution Approach 2:
The patent introduces an intermediary pattern (projection pattern) as a mediator between the measurement system and the object surface. By projecting patterns onto the object and capturing their deformation, the system indirectly measures surface profiles without direct mechanical contact, simplifying the measurement system while maintaining precision.
2Adaptability or versatility
If conventional measuring techniques are used, then measurement can be performed, but adaptability for various object geometries and orientations is limited
Solution Approach 1:
The patent employs dynamic rotation mechanisms that allow the object to be rotated in multiple directions during measurement. The object-rotation unit enables the object to be positioned at various angles and orientations, while the pattern-rotation unit dynamically adjusts the projection pattern orientation. This dynamic adjustment capability provides high adaptability to different object geometries while maintaining ease of operation through automated positioning.
Solution Approach 2:
The measurement system is designed with universal functionality to handle various object types and geometries. The combination of multi-directional object rotation, pattern rotation, and optical measurement capabilities allows the same system to measure diverse surface profiles without requiring specialized equipment for each object type, thereby improving both adaptability and operational simplicity.
3Measurement precision
If the measurement unit is positioned at a fixed location, then device complexity is reduced, but measurement precision for objects of varying sizes and orientations decreases
Solution Approach 1:
Instead of moving the measurement unit through complex trajectories, the patent employs dynamic rotation of the object and projection pattern. The measurement unit remains at a relatively fixed position while the object-rotation unit and pattern-rotation unit dynamically adjust orientations, achieving high measurement precision for objects of varying sizes and orientations without complex positioning mechanisms.
Solution Approach 2:
Instead of moving the measurement system to different positions and angles to capture objects, the patent inverts the approach by keeping the measurement system stationary and rotating the object and projection pattern. This inversion simplifies the positioning complexity while maintaining or improving measurement precision through the dynamic interaction between the fixed measurement unit and rotating object-pattern system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient three-dimensional surface profiling of objects by aligning the linear light beam perpendicular to the scanning direction, improving measurement accuracy and adaptability for objects of varying sizes and orientations, while reducing the need for frequent repositioning of the sensor.
Implementation Method 1
a projection unit which projects a pattern on the object from a projection direction
Implementation Method 2
a measurement unit which is displaced at a difference position for the projection unit and takes an image of the pattern from a direction different from the projection direction
Data Source
AI summary
There is provided a profile measuring apparatus which measures a profile of an object including: a projection unit which projects a pattern on the object from a projection direction; a measurement unit, which is displaced at a difference position for the projection unit and takes an image of the pattern from a direction different from the projection direction to measure a position on a surface of the object based on an image data obtained with the taken image; an object-rotation unit which rotates the object in two directions; and a pattern-rotation unit which is connected to the projection unit so as to be able to rotate the pattern relative to the object-rotation unit.